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Impact of Pseudo-Random Modulation on Measured Conducted EMI

Pena-Quintal, Angel; Loschi, Hermes; Smolenski, Robert; Sumner, Mark; Thomas, Dave; Greedy, Steve; Lezynski, Piotr; Leferink, Frank

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Authors

Hermes Loschi

Robert Smolenski

MARK SUMNER MARK.SUMNER@NOTTINGHAM.AC.UK
Professor of Electrical Energy Systems

Dave Thomas

Piotr Lezynski

Frank Leferink



Abstract

This paper demonstrates that using conventional frequency scanning methods for the evaluation of conducted electromagnetic interference generated by DC/DC converters can give misleading results when pseudo-random modulation is used as part of the converter control scheme. The paper therefore proposes that the resolution bandwidth of the super heterodyne EMI test receiver used for measurements and the dwell time should be adjusted to match the control parameters of the random modulation scheme. The use of different values for resolution bandwidth and dwell time is demonstrated and measurements for random and fixed modulation schemes are compared.

Citation

Pena-Quintal, A., Loschi, H., Smolenski, R., Sumner, M., Thomas, D., Greedy, S., …Leferink, F. (2022). Impact of Pseudo-Random Modulation on Measured Conducted EMI. IEEE Electromagnetic Compatibility Magazine, 11(2), 84-92. https://doi.org/10.1109/memc.2022.9873829

Journal Article Type Article
Acceptance Date Jul 21, 2022
Online Publication Date Aug 31, 2022
Publication Date 2022
Deposit Date Apr 13, 2023
Publicly Available Date Apr 13, 2023
Journal IEEE Electromagnetic Compatibility Magazine
Print ISSN 2162-2264
Electronic ISSN 2162-2272
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 11
Issue 2
Pages 84-92
DOI https://doi.org/10.1109/memc.2022.9873829
Keywords Frequency modulation , Electromagnetic interference , Receivers , Switches , Bandwidth , Electromagnetic compatibility , Frequency conversion, DC-DC power convertors , electromagnetic interference , interference suppression, conventional frequency scannin
Public URL https://nottingham-repository.worktribe.com/output/11188041
Publisher URL https://ieeexplore.ieee.org/document/9873829

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