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An Open Source, FPGA-Based Bit Error Ratio Tester for Serial Communications

Basford, M. J.; Pena-Quintal, A. E.; Greedy, S.; Sumner, M.; Thomas, D. W. P.

Authors

M. J. Basford

ANGEL PENA QUINTAL Angel.PenaQuintal2@nottingham.ac.uk
Marie Sklodowska-Curie Early Stageresearcher

MARK SUMNER mark.sumner@nottingham.ac.uk
Professor of Electrical Energy Systems

DAVID THOMAS dave.thomas@nottingham.ac.uk
Professor of Electromagnetics Applications



Abstract

This paper discusses the design of a FPGA-based Bit Error Ratio (BER) measurement system in a serial communication link under electromagnetic emissions. The BER measurement is an important figure for the reliability of digital communication systems. Generally, the equipment involved to measure BER is prohibitively expensive. This paper demonstrates the design, construction and verification of an Open Source System (OSS), with all design files being made freely accessible to the public for use in general or highly specialized BER measurements. The methods used for programming the Hardware Description Language (HDL) modules were done as simple as possible to facilitate easy integration into experiments for academics with limited experience in HDL usage.

Citation

Basford, M. J., Pena-Quintal, A. E., Greedy, S., Sumner, M., & Thomas, D. W. P. (2020). An Open Source, FPGA-Based Bit Error Ratio Tester for Serial Communications. In Proceedings of 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE. https://doi.org/10.1109/emceurope48519.2020.9245786

Conference Name 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
Conference Location Rome, Italy
Start Date Sep 23, 2020
End Date Sep 25, 2020
Acceptance Date Apr 20, 2020
Online Publication Date Nov 6, 2020
Publication Date Sep 23, 2020
Deposit Date Apr 7, 2021
Publicly Available Date Apr 7, 2021
Series Title International Symposium on Electromagnetic Compatibility - EMC EUROPE
Series ISSN 2325-0364
Book Title Proceedings of 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
ISBN 9781728155791
DOI https://doi.org/10.1109/emceurope48519.2020.9245786
Public URL https://nottingham-repository.worktribe.com/output/5435025
Publisher URL https://ieeexplore.ieee.org/document/9245786
Additional Information © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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