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Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques

Al-Aufi, Y.A.; Hewakandamby, B.N.; Dimitrakis, G.; Holmes, M.; Hasan, A.; Watson, N.J.

Authors

Y.A. Al-Aufi

M. Holmes

A. Hasan



Journal Article Type Article
Publication Date 2019-04
Journal Flow Measurement and Instrumentation
Print ISSN 0955-5986
Publisher Elsevier
Peer Reviewed Peer Reviewed
Volume 66
Pages 67-78
APA6 Citation Al-Aufi, Y., Hewakandamby, B., Dimitrakis, G., Holmes, M., Hasan, A., & Watson, N. (2019). Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques. Flow Measurement and Instrumentation, 66, 67-78. https://doi.org/10.1016/j.flowmeasinst.2019.02.008
DOI https://doi.org/10.1016/j.flowmeasinst.2019.02.008
Keywords Modelling and Simulation; Instrumentation; Electrical and Electronic Engineering; Computer Science Applications
Publisher URL https://www.sciencedirect.com/science/article/pii/S0955598618302437
Additional Information This article is maintained by: Elsevier; Article Title: Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques; Journal Title: Flow Measurement and Instrumentation; CrossRef DOI link to publisher maintained version: https://doi.org/10.1016...owmeasinst.2019.02.008; Content Type: article; Copyright: © 2019 Elsevier Ltd. All rights reserved.

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