Current-induced degradation behaviors of InGaN/GaN multiple quantum well UV photodetectors: Role of electrically active defects
(2022)
Journal Article
Dalapati, P., Almalki, A., Alhassan, S., Alotaibi, S., Huwayz, M. A., Nakabayashi, T., Egawa, T., Miyoshi, M., & Henini, M. (2022). Current-induced degradation behaviors of InGaN/GaN multiple quantum well UV photodetectors: Role of electrically active defects. Sensors and Actuators A: Physical, 347, Article 113935. https://doi.org/10.1016/j.sna.2022.113935
To examine the critical role of electrically active defects and surface states in InGaN/GaN multiple quantum well (MQW) ultraviolet photodetectors (UV-PDs), the study of degradation mechanisms in such devices is very important. In this work, we have... Read More about Current-induced degradation behaviors of InGaN/GaN multiple quantum well UV photodetectors: Role of electrically active defects.