Benchmarking TERS and TEPL probes: towards a reference sample for quantification of near-field enhancement factors in gap and non-gap modes
(2025)
Journal Article
Kerfoot, J., Legge, E. J., Collins, A., Chauhan, J., Rossnagel, K., H. Beton, P., Mellor, C. J., Pollard, A. J., Rance, G. A., & W. George, M. (2025). Benchmarking TERS and TEPL probes: towards a reference sample for quantification of near-field enhancement factors in gap and non-gap modes. Analyst, https://doi.org/10.1039/D5AN00456J
Benchmarking the near-field signal enhancement attained using plasmonic metal-coated atomic force microscopy (AFM) probes for tip-enhanced Raman spectroscopy (TERS) and tip-enhanced photoluminescence (TEPL) measurements is challenging given the absen... Read More about Benchmarking TERS and TEPL probes: towards a reference sample for quantification of near-field enhancement factors in gap and non-gap modes.