Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method
(2017)
Journal Article
Fang, Y., Jayasuriya, D., Furniss, D., Tang, Z., Sojka, Ł., Markos, C., …Benson, T. (2017). Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method. Optical and Quantum Electronics, 49, Article 237. https://doi.org/10.1007/s11082-017-1057-9
The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to e... Read More about Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method.