True-color 3D surface metrology for additive manufacturing using interference microscopy
(2017)
Presentation / Conference Contribution
DiSciacca, J., Gomez, C., Thompson, A., Lawes, S., Leach, R., Colonna de Lega, X., & de Groot, P. (2017). True-color 3D surface metrology for additive manufacturing using interference microscopy.
Coherence scanning interferometry (CSI) is widely used for surface topography characterisation. With the ability to measure both rough surfaces with the high slopes and optical finishes, CSI has made contibutions in fields from industrial machining t... Read More about True-color 3D surface metrology for additive manufacturing using interference microscopy.