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Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise

Wang, Hui; Blencowe, M.P.; Armour, A.D.; Rimberg, A.J.

Authors

Hui Wang

M.P. Blencowe

A.J. Rimberg



Abstract

We give a semiclassical analysis of the average photon number as well as photon number variance (Fano factor F) for a Josephson junction (JJ) embedded microwave cavity system, where the JJ is subject to a fluctuating (i.e., noisy) bias voltage with finite dc average. Through the ac Josephson effect, the dc voltage bias drives the effectively nonlinear microwave cavity mode into an amplitude squeezed state (F

Citation

Wang, H., Blencowe, M., Armour, A., & Rimberg, A. (2017). Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise. Physical Review B, 96(10), https://doi.org/10.1103/PhysRevB.96.104503

Journal Article Type Article
Acceptance Date Aug 8, 2017
Publication Date Sep 5, 2017
Deposit Date Sep 6, 2017
Publicly Available Date Mar 29, 2024
Journal Physical Review B
Print ISSN 2469-9950
Electronic ISSN 2469-9969
Publisher American Physical Society
Peer Reviewed Peer Reviewed
Volume 96
Issue 10
DOI https://doi.org/10.1103/PhysRevB.96.104503
Public URL https://nottingham-repository.worktribe.com/output/880964
Publisher URL https://journals.aps.org/prb/abstract/10.1103/PhysRevB.96.104503

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