Lei Shen
DC-Link Capacitor Second Carrier Band Switching Harmonic Current Reduction in Two-Level Back-to-Back Converters
Shen, Lei; Bozhko, Serhiy; Hill, Christopher Ian; Wheeler, Patrick
Authors
Professor SERHIY BOZHKO serhiy.bozhko@nottingham.ac.uk
PROFESSOR OF AIRCRAFT ELECTRIC POWER SYSTEMS
Christopher Ian Hill
Professor PATRICK WHEELER pat.wheeler@nottingham.ac.uk
PROFESSOR OF POWER ELECTRONIC SYSTEMS
Abstract
© 1986-2012 IEEE. This paper proposes an active switching harmonic current reduction method within the dc-link capacitor of two-level, three-phase, back-to-back converters. This method is based on the derived analytical solution for switching harmonic currents in the dc-link. It is shown that by controlling the pulse width modulation carrier waveform's phase angles, the harmonics in the second carrier band of the rectifier and the inverter can be synchronized such that cancellation occurs in the dc-link capacitor. This synchronization is provided by harmonic phase feedback control. The feasibility of the proposed approach has been verified experimentally and results are presented in this paper.
Citation
Shen, L., Bozhko, S., Hill, C. I., & Wheeler, P. (2018). DC-Link Capacitor Second Carrier Band Switching Harmonic Current Reduction in Two-Level Back-to-Back Converters. IEEE Transactions on Power Electronics, 33(4), 3567-3574. https://doi.org/10.1109/TPEL.2017.2706972
Journal Article Type | Article |
---|---|
Acceptance Date | May 6, 2017 |
Online Publication Date | May 23, 2017 |
Publication Date | 2018-04 |
Deposit Date | Aug 30, 2017 |
Publicly Available Date | Aug 30, 2017 |
Journal | IEEE Transactions on Power Electronics |
Print ISSN | 0885-8993 |
Electronic ISSN | 1941-0107 |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Volume | 33 |
Issue | 4 |
Pages | 3567-3574 |
DOI | https://doi.org/10.1109/TPEL.2017.2706972 |
Keywords | converters, AC-DC power conversion, capacitors, harmonic analysis, switching functions, power quality, pulse-width modulation, testing |
Public URL | https://nottingham-repository.worktribe.com/output/861811 |
Publisher URL | http://ieeexplore.ieee.org/document/7932496/ |
Additional Information | © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works |
Contract Date | Aug 30, 2017 |
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