Rapid wide-field heterodyne interferometry with custom 2D CMOS camera

Zhang, J.; See, C. W.; Smith, R. J.; Johnston, N. S.; Pitter, M. C.; Somekh, M. G.; Light, R. A.

Abstract

© The Institution of Engineering and Technology 2015. A wide-field pseudo-heterodyne interference contrast microscope is described, which employs a complementary metal-oxide semiconductor (CMOS) phase-sensitive camera. The use of multiple wells in the camera enables extremely rapid measurement of a full phase field at high resolution and the modulation frequency is not limited by the camera frame rate. The high data acquisition frequency allows the effects of microphonics to be frozen to mitigate the effect of lowfrequency disturbance.

Citation

Zhang, J., See, C. W., Smith, R. J., Johnston, N. S., Pitter, M. C., Somekh, M. G., & Light, R. A. (2015). Rapid wide-field heterodyne interferometry with custom 2D CMOS camera. Electronics Letters, 51(6), 479-480. https://doi.org/10.1049/el.2015.0268

• Journal Article Type: Article
• Publication Date: Mar 19, 2015
• Deposit Date: Jul 6, 2015
• Publicly Available Date: Jul 6, 2015
• Journal: Electronics Letters
• Print ISSN: 0013-5194
• Electronic ISSN: 1350-911X
• Publisher: Institution of Engineering and Technology (IET)
• Peer Reviewed: Peer Reviewed
• Volume: 51
• Issue: 6
• Pages: 479-480
• DOI: https://doi.org/10.1049/el.2015.0268
• Keywords: heterodyne detection; CMOS image sensors; optical microscopes; light interferometry
• Public URL: https://nottingham-repository.worktribe.com/output/747159
• Publisher URL: http://digital-library.theiet.org/content/journals/10.1049/el.2015.0268