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Unique determination of “subatomic” contrast by imaging covalent backbonding

Sweetman, Adam; Rahe, Philipp; Moriarty, Philip

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Authors

Adam Sweetman

Philipp Rahe



Abstract

The origin of so-called “subatomic” resolution in dynamic force microscopy has remained controversial since its first observation in 2000. A number of detailed experimental and theoretical studies have identified different possible physicochemical mechanisms potentially giving rise to subatomic contrast. In this study, for the first time we are able to assign the origin of a specific instance of subatomic contrast as being due to the back bonding of a surface atom in the tip−sample junction.

Citation

Sweetman, A., Rahe, P., & Moriarty, P. (2014). Unique determination of “subatomic” contrast by imaging covalent backbonding. Nano Letters, 14(5), https://doi.org/10.1021/nl4041803

Journal Article Type Article
Publication Date Mar 14, 2014
Deposit Date Feb 25, 2016
Publicly Available Date Feb 25, 2016
Journal Nano Letters
Print ISSN 1530-6984
Electronic ISSN 1530-6992
Publisher American Chemical Society
Peer Reviewed Peer Reviewed
Volume 14
Issue 5
DOI https://doi.org/10.1021/nl4041803
Keywords NC-AFM; DFM; subatomic; Si(111); qPlus; UHV
Public URL https://nottingham-repository.worktribe.com/output/725073
Publisher URL http://pubs.acs.org/doi/abs/10.1021/nl4041803
Additional Information This document is the Accepted Manuscript version of a Published Work that appeared in final form in Nano Letters, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see [ihttp://pubs.acs.org/doi/abs/10.1021/nl4041803

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