Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis

Stirling, Julian; Woolley, Richard; Moriarty, Philip

Abstract

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure.

Citation

Stirling, J., Woolley, R., & Moriarty, P. (2013). Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis. Review of Scientific Instruments, 84(113701), Article 113701. https://doi.org/10.1063/1.4827076

• Journal Article Type: Article
• Publication Date: Nov 1, 2013
• Deposit Date: Apr 24, 2014
• Publicly Available Date: Apr 24, 2014
• Journal: Review of Scientific Instruments
• Print ISSN: 0034-6748
• Electronic ISSN: 0034-6748
• Publisher: American Institute of Physics
• Peer Reviewed: Peer Reviewed
• Volume: 84
• Issue: 113701
• Article Number: 113701
• DOI: https://doi.org/10.1063/1.4827076
• Public URL: https://nottingham-repository.worktribe.com/output/718226
• Publisher URL: http://scitation.aip.org/content/aip/journal/rsi/84/11/10.1063/1.4827076