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Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis

Stirling, Julian; Woolley, Richard; Moriarty, Philip

Authors

Julian Stirling

Richard Woolley

Philip Moriarty philip.moriarty@nottingham.ac.uk

Abstract

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure.

Journal Article Type Article
Publication Date Nov 1, 2013
Journal Review of Scientific Instruments
Print ISSN 0034-6748
Electronic ISSN 0034-6748
Publisher AIP Publishing
Peer Reviewed Peer Reviewed
Volume 84
Issue 113701
Article Number 113701
Institution Citation Stirling, J., Woolley, R., & Moriarty, P. (2013). Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis. Review of Scientific Instruments, 84(113701), doi:10.1063/1.4827076
DOI https://doi.org/10.1063/1.4827076
Publisher URL http://scitation.aip.org/content/aip/journal/rsi/84/11/10.1063/1.4827076
Copyright Statement Copyright information regarding this work can be found at the following address: http://creativecommons.org/licenses/by/4.0

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Copyright Statement
Copyright information regarding this work can be found at the following address: http://creativecommons.org/licenses/by/4.0




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