Unified Framework for the Effective Rate Analysis of Wireless Communication Systems Over MISO Fading Channels

You, Minglei; Sun, Hongjian; Jiang, Jing; Zhang, Jiayi

Abstract

This paper proposes a unified framework for the effective rate analysis over arbitrary correlated and not necessarily identical multiple-input single-output (MISO) fading channels, which uses the moment generating function (MGF) based approach and H transform representation. The proposed framework has the potential to simplify the cumbersome analysis procedure compared with the probability density function-based approach. Moreover, the effective rates over two specific fading scenarios are investigated, namely, independent but not necessarily identical distributed (i.n.i.d.) MISO hyper Fox's H fading channels and arbitrary correlated generalized K fading channels. The exact analytical representations for these two scenarios are also presented. By substituting corresponding parameters, the effective rates in various practical fading scenarios, such as Rayleigh, Nakagami-m, Weibull/Gamma, and generalized K fading channels, are readily available. In addition, asymptotic approximations are provided for the proposed H transform and MGF-based approach as well as for the effective rate over i.n.i.d. MISO hyper Fox's H fading channels. Simulations under various fading scenarios are also presented, which support the validity of the proposed method.

Citation

You, M., Sun, H., Jiang, J., & Zhang, J. (2017). Unified Framework for the Effective Rate Analysis of Wireless Communication Systems Over MISO Fading Channels. IEEE Transactions on Communications, 65(4), 1775-1785. https://doi.org/10.1109/tcomm.2016.2638901

• Journal Article Type: Article
• Acceptance Date: Nov 30, 2016
• Online Publication Date: Dec 13, 2016
• Publication Date: 2017-04
• Deposit Date: Oct 28, 2021
• Publicly Available Date: Nov 10, 2021
• Journal: IEEE Transactions on Communications
• Print ISSN: 0090-6778
• Electronic ISSN: 1558-0857
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 65
• Issue: 4
• Pages: 1775-1785
• DOI: https://doi.org/10.1109/tcomm.2016.2638901
• Keywords: Electrical and Electronic Engineering
• Public URL: https://nottingham-repository.worktribe.com/output/6537575
• Publisher URL: https://ieeexplore.ieee.org/document/7782422
• Additional Information: © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.