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Band gap measurements of monolayer h-BN and insights into carbon-related point defects

Román, Ricardo Javier Peña; Costa, Fábio J. R.; Zobelli, Alberto; Elias, Christine; Valvin, Pierre; Cassabois, Guillaume; GIL, BERNARD; Summerfield, Alex; Cheng, Tin S; Mellor, Chris J; Beton, Peter H; Novikov, Sergei V; Zagonel, Luiz Fernando

Band gap measurements of monolayer h-BN and insights into carbon-related point defects Thumbnail


Authors

Ricardo Javier Peña Román

Fábio J. R. Costa

Alberto Zobelli

Christine Elias

Pierre Valvin

Guillaume Cassabois

BERNARD GIL

Alex Summerfield

TIN CHENG Tin.Cheng@nottingham.ac.uk
Research Fellow

PETER BETON peter.beton@nottingham.ac.uk
Professor of Physics

Luiz Fernando Zagonel



Abstract

Being a flexible wide band gap semiconductor, hexagonal boron nitride (h-BN) has great potential for technological applications like efficient deep ultraviolet light sources, building block for two-dimensional heterostructures and room temperature single photon emitters in the ultraviolet and visible spectral range. To enable such applications, it is mandatory to reach a better understanding of the electronic and optical properties of h-BN and the impact of various structural defects. Despite the large efforts in the last years, aspects such as the electronic band gap value, the exciton binding energy and the effect of point defects remained elusive, particularly when considering a single monolayer. Here, we directly measured the density of states of a single monolayer of h-BN epitaxially grown on highly oriented pyrolytic graphite, by performing low temperature scanning tunneling microscopy (STM) and spectroscopy (STS). The observed h-BN electronic band gap on defect-free regions is (6.8 ± 0.2) eV. Using optical spectroscopy to obtain the h-BN optical band gap, the exciton binding energy is determined as being of (0.7 ± 0.2) eV. In addition, the locally excited cathodoluminescence and photoluminescence show complex spectra that are typically associated to intragap states related to carbon defects. Moreover, in some regions of the monolayer h-BN we identify, using STM, point defects which have intragap electronic levels around 2.0 eV below the Fermi level.

Citation

Román, R. J. P., Costa, F. J. R., Zobelli, A., Elias, C., Valvin, P., Cassabois, G., …Zagonel, L. F. (2021). Band gap measurements of monolayer h-BN and insights into carbon-related point defects. 2D Materials, 8(4), Article 044001. https://doi.org/10.1088/2053-1583/ac0d9c

Journal Article Type Article
Acceptance Date Jun 22, 2021
Online Publication Date Jul 7, 2021
Publication Date 2021-10
Deposit Date Jun 28, 2021
Publicly Available Date Jul 8, 2022
Journal 2D Materials
Electronic ISSN 2053-1583
Publisher IOP Publishing
Peer Reviewed Peer Reviewed
Volume 8
Issue 4
Article Number 044001
DOI https://doi.org/10.1088/2053-1583/ac0d9c
Keywords Mechanical Engineering; General Materials Science; Mechanics of Materials; General Chemistry; Condensed Matter Physics
Public URL https://nottingham-repository.worktribe.com/output/5724308
Publisher URL https://iopscience.iop.org/article/10.1088/2053-1583/ac0d9c
Additional Information This is the Accepted Manuscript version of an article accepted for publication in 2D Materials. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://iopscience.iop.org/article/10.1088/2053-1583/ac0d9c

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