Data Links Modelling under Radiated EMI and its Impact on Sampling Errors in the Physical Layer

Pena-Quintal, A. E.; Basford, M. J.; Niewiadomski, K.; Greedy, S.; Sumner, M.; Thomas, D. W. P.

Abstract

This paper deals with the effects of radiated EMI on serial communication links using software modelling with particular emphasis on the physical layer. The effect of EMI in data links is an important problem to solve in many harsh environments such as the automotive and the transport sector as well as communications, in fact the EMI effect is able to produce sampling errors in digital/binary operations. Currently binding standards prefer the analysis in frequency domain to account for EMI impact, however when dealing with data links, time domain analysis might report useful information, therefore a link between those two is needed. The cable models are developed using SACAMOS modelling software, taking into consideration the frequency parameters. The model can be used on almost any SPICE simulator to analyse the effect of EMI. The simulations performed in this research are verified on a real laboratory experiment in order to demonstrate the capabilities of SACAMOS.

Citation

Pena-Quintal, A. E., Basford, M. J., Niewiadomski, K., Greedy, S., Sumner, M., & Thomas, D. W. P. (2020). Data Links Modelling under Radiated EMI and its Impact on Sampling Errors in the Physical Layer. In Proceedings of 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE. https://doi.org/10.1109/emceurope48519.2020.9245670

• Presentation Conference Type: Edited Proceedings
• Conference Name: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
• Start Date: Sep 23, 2020
• End Date: Sep 25, 2020
• Acceptance Date: Apr 20, 2020
• Online Publication Date: Nov 6, 2020
• Publication Date: Sep 23, 2020
• Deposit Date: Apr 7, 2021
• Publicly Available Date: Apr 7, 2021
• Series Title: IEEE International Symposium on Electromagnetic Compatibility - EMC Europe
• Series ISSN: 2325-0364
• Book Title: Proceedings of 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
• ISBN: 9781728155791
• DOI: https://doi.org/10.1109/emceurope48519.2020.9245670
• Public URL: https://nottingham-repository.worktribe.com/output/5434985
• Publisher URL: https://ieeexplore.ieee.org/abstract/document/9245670
• Additional Information: © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.