Influence of Thermal Aging on the Winding Thermal Conductivity in Low Voltage Electrical Machines

Madonna, Vincenzo; Giangrande, Paolo; Galea, Michael

Abstract

It is widely acknowledged that thermal aging can have a detrimental effect on the reliability and lifetime expectancy of electrical machines. Long exposure times to high temperature can deteriorate the dielectric properties of the electrical insulation system. At the same time, high temperature can strongly affect thermo-physical properties of polymeric materials, which are commonly employed for the insulation system of low voltage motors. This work experimentally investigates what is the effect of thermal aging on the winding equivalent thermal conductivity in low voltage electrical machines. The life results of accelerated thermal aging tests, carried out on suitable specimens, are processed through a Weibull-Bayesian approach. The variation of the equivalent winding thermal conductivity with thermal aging is ultimately correlated to the cumulative thermal aging of the insulation system.

Citation

Madonna, V., Giangrande, P., & Galea, M. (2020, November). Influence of Thermal Aging on the Winding Thermal Conductivity in Low Voltage Electrical Machines. Presented at 2020 23rd International Conference on Electrical Machines and Systems (ICEMS), Hamamatsu, Japan

• Presentation Conference Type: Edited Proceedings
• Conference Name: 2020 23rd International Conference on Electrical Machines and Systems (ICEMS)
• Start Date: Nov 24, 2020
• End Date: Nov 27, 2020
• Acceptance Date: Jun 26, 2020
• Online Publication Date: Dec 22, 2020
• Publication Date: Nov 24, 2020
• Deposit Date: Feb 26, 2021
• Publicly Available Date: Feb 26, 2021
• Publisher: Institute of Electrical and Electronics Engineers
• Series Title: International Conference on Electrical Machines and Systems (ICEMS)
• Series ISSN: 2640-7841
• ISBN: 9781728189307
• DOI: https://doi.org/10.23919/icems50442.2020.9291167
• Keywords: Aging, Insulation, Thermal conductivity, Windings, Conductivity, Thermal analysis, Temperature measurement
• Public URL: https://nottingham-repository.worktribe.com/output/5352817
• Publisher URL: https://ieeexplore.ieee.org/abstract/document/9291167
• Additional Information: © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.