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Performance evaluation of a new 30 μm thick GaAs X-ray detector grown by MBE

Lioliou, Grammatiki; Poyser, Caroline L.; Whale, Josh; Campion, Richard P.; Kent, Anthony J.; Barnett, Anna

Performance evaluation of a new 30 μm thick GaAs X-ray detector grown by MBE Thumbnail


Authors

Grammatiki Lioliou

Caroline L. Poyser

Josh Whale

Anna Barnett



Abstract

A circular mesa (400 μm diameter) GaAs p+-i-n+ photodiode with a 30 μm thick i layer was characterized for its performance as a detector in photon counting x-ray spectroscopy at 20 °C. The detector was fabricated from material grown by molecular beam epitaxy (MBE). An earlier MBE-grown detector fabricated using a different fabrication process and material from a different area of the same epiwafer was shown to suffer from: relatively high leakage current at high temperatures; a high effective carrier concentration that limited its depletion layer width; and material imperfections (butterfly defects) [Lioliou et al 2019 Nucl. Instrum. Methods Phys. Res. A 946 162670]. However, the new detector has better performance (lower leakage current and effective carrier concentration within the i layer). Using the new detector and low noise readout electronics, an energy resolution of 750 eV ± 20 eV Full Width at Half Maximum (FWHM) at 5.9 keV was achieved at 20 °C, equal to that reported for high quality GaAs detectors made from high quality material grown by metalorganic vapour phase epitaxy [Lioliou et al 2017 J. Appl. Phys. 122 244506]. The results highlight the substantially different performances of detectors made from the same epiwafer when the wafer qualities are not uniform and the effects of different fabrication processes.

Citation

Lioliou, G., Poyser, C. L., Whale, J., Campion, R. P., Kent, A. J., & Barnett, A. (2021). Performance evaluation of a new 30 μm thick GaAs X-ray detector grown by MBE. Materials Research Express, 8(2), Article 025909. https://doi.org/10.1088/2053-1591/abe73c

Journal Article Type Article
Acceptance Date Feb 17, 2021
Online Publication Date Feb 26, 2021
Publication Date Feb 26, 2021
Deposit Date Mar 4, 2021
Publicly Available Date Mar 4, 2021
Journal Materials Research Express
Electronic ISSN 2053-1591
Publisher IOP Publishing
Peer Reviewed Peer Reviewed
Volume 8
Issue 2
Article Number 025909
DOI https://doi.org/10.1088/2053-1591/abe73c
Keywords Electronic, Optical and Magnetic Materials; Surfaces, Coatings and Films; Polymers and Plastics; Metals and Alloys; Biomaterials
Public URL https://nottingham-repository.worktribe.com/output/5335532
Publisher URL https://iopscience.iop.org/article/10.1088/2053-1591/abe73c

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