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Hafele and Keating on a chip: Sagnac interferometry with a single clock

Johnson, Jamie; Foxon, Bethany; Atkocius, Vilius; Gentile, Fabio; Jammi, Sindhu; Poulios, Konstantinos; Fernholz, Thomas

Hafele and Keating on a chip: Sagnac interferometry with a single clock Thumbnail


Authors

Jamie Johnson

Bethany Foxon

Vilius Atkocius

Fabio Gentile

Sindhu Jammi

Konstantinos Poulios



Contributors

Selim M. Shahriar
Editor

Jacob Scheuer
Editor

Abstract

We describe our progress in the development of an atom based rotation sensor, which employs state-dependent trapping potentials to transport ultracold atoms along a closed path and perform Sagnac interferometry. Whilst guided atom interferometers are sought after to build miniaturized devices that overcome size restrictions from free-falling atoms, fully trapped interferometers also remove free-propagation along an atomic waveguide. This provides additional control of motion, e.g. removing wave-packet dispersion and enabling operation that remains independent of external acceleration. Our experimental scheme relies on radio-frequency and microwave-fields, which are partly generated via atom-chip technology, providing a step towards implementing a small, robust, and eventually portable atomic-gyroscope.

Citation

Johnson, J., Foxon, B., Atkocius, V., Gentile, F., Jammi, S., Poulios, K., & Fernholz, T. (2020, February). Hafele and Keating on a chip: Sagnac interferometry with a single clock. Presented at Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, San Francisco, United States

Presentation Conference Type Edited Proceedings
Conference Name Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
Start Date Feb 1, 2020
End Date Feb 6, 2020
Acceptance Date Jan 10, 2020
Online Publication Date Feb 25, 2020
Publication Date Feb 25, 2020
Deposit Date Mar 2, 2020
Publicly Available Date Mar 5, 2020
Publisher Society of Photo-optical Instrumentation Engineers
Peer Reviewed Peer Reviewed
Volume 11296
Article Number 1129631
Series Title SPIE - International Society for Optical Engineering. Proceedings
Series ISSN 1996-756X
Book Title Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
ISBN 9781510633551
DOI https://doi.org/10.1117/12.2552686
Keywords Atomic sensors, interferometry, inertial sensing, Sagnac interferometer, ring-shaped atom traps, radio-frequency dressed potentials
Public URL https://nottingham-repository.worktribe.com/output/4050540
Publisher URL https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11296/2552686/Hafele-and-Keating-on-a-chip--Sagnac-interferometry-with/10.1117/12.2552686.short?SSO=1

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