Jiajun Yang
Impedance-based Sensitivity Analysis of Dual Active Bridge DC-DC Converter
Yang, Jiajun; Buticchi, Giampaolo; Yan, Hao; Gu, Chunyang; Zhang, He; Wheeler, Pat
Authors
Giampaolo Buticchi
Hao Yan
Chunyang Gu
He Zhang
Professor PATRICK WHEELER pat.wheeler@nottingham.ac.uk
PROFESSOR OF POWER ELECTRONIC SYSTEMS
Abstract
The sensitivity analysis of a circuit reflects the robustness of this circuit to the relevant parameters. This paper investigates the sensitivity of input impedance of DAB converter, which is widely adopted in solid-state transformer (SST) and dc microgrid on more electric aircraft (MEA). In this paper, an improved impedance-based small-signal averaged model is developed to carry out the sensitivity analysis. Bode plots will be used as main analysis tool. The small signal model is compared to a complete switching model to confirm the validity of the proposed approach.
Citation
Yang, J., Buticchi, G., Yan, H., Gu, C., Zhang, H., & Wheeler, P. (2019, April). Impedance-based Sensitivity Analysis of Dual Active Bridge DC-DC Converter. Presented at IEEE 13th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG 2019)), Sonderborg, Denmark
Presentation Conference Type | Edited Proceedings |
---|---|
Conference Name | IEEE 13th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG 2019)) |
Start Date | Apr 23, 2019 |
End Date | Apr 25, 2019 |
Acceptance Date | Feb 18, 2019 |
Online Publication Date | Apr 25, 2019 |
Publication Date | 2019-04 |
Deposit Date | Mar 5, 2020 |
Publicly Available Date | Mar 6, 2020 |
Pages | 1-5 |
Series ISSN | 2166-9546 |
Book Title | Proceedings on the 2019 IEEE 13th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG) |
ISBN | 978-1-7281-3203-7 |
DOI | https://doi.org/10.1109/CPE.2019.8862418 |
Public URL | https://nottingham-repository.worktribe.com/output/3911472 |
Publisher URL | https://ieeexplore.ieee.org/document/8862418 |
Additional Information | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works |
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