Insulation Capacitance as Diagnostic Marker for Thermally Aged, Low Voltage Electrical Machines

Madonna, Vincenzo; Giangrande, Paolo; Zhao, Weiduo; Wang, Yinli; Zhang, He; Galea, Michael

Abstract

© 2019 IEEE. Thermal aging is considered as the principal insulation stress factor in low voltage electrical machines (EMs). Once the insulation reaches its end-of-life, a complete EM out of service can be caused within few operating cycles/hours. In this paper, the strand to strand insulation capacitance (IC) of thermally-stressed windings for low voltage EMs, is experimentally monitored. Its trend is analysed against the cumulative thermal aging with the objective of extrapolating an insulation lifetime prediction tool. The aged specimens are made of a class 200, round enameled magnet wire (modified polyester base coating and polyamide-imide over coating). This wire topology is widely adopted in low voltage EMs employed in aerospace and automotive applications. The outcome of the presented analysis can be either used for diagnostic purposes or for improving the EMs insulation design procedure.

Citation

Madonna, V., Giangrande, P., Zhao, W., Wang, Y., Zhang, H., & Galea, M. (2019, August). Insulation Capacitance as Diagnostic Marker for Thermally Aged, Low Voltage Electrical Machines. Presented at 2019 22nd International Conference on Electrical Machines and Systems (ICEMS), Harbin, China

• Presentation Conference Type: Edited Proceedings
• Conference Name: 2019 22nd International Conference on Electrical Machines and Systems (ICEMS)
• Start Date: Aug 11, 2019
• End Date: Aug 14, 2019
• Acceptance Date: May 16, 2019
• Online Publication Date: Dec 5, 2019
• Publication Date: 2019-08
• Deposit Date: Feb 7, 2020
• Publicly Available Date: Feb 7, 2020
• Pages: 1-5
• Series ISSN: 2642-5513
• Book Title: Proceedings of 2019 22nd International Conference on Electrical Machines and Systems (ICEMS)
• ISBN: 978-1-7281-3399-7
• DOI: https://doi.org/10.1109/ICEMS.2019.8921657
• Public URL: https://nottingham-repository.worktribe.com/output/3662929
• Publisher URL: https://ieeexplore.ieee.org/document/8921657
• Additional Information: © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.