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High-Frequency Elastic Coupling at the Interface of van der Waals Nanolayers Imaged by Picosecond Ultrasonics

Greener, Jake D.G.; de Lima Savi, Elton; Akimov, Andrey V.; Raetz, Samuel; Kudrynskyi, Zakhar; Kovalyuk, Zakhar D.; Chigarev, Nikolay; Kent, Anthony; Patan�, Amalia; Gusev, Vitalyi E.

High-Frequency Elastic Coupling at the Interface of van der Waals Nanolayers Imaged by Picosecond Ultrasonics Thumbnail


Authors

Jake D.G. Greener

Elton de Lima Savi

ANDREY AKIMOV ANDREY.AKIMOV@NOTTINGHAM.AC.UK
Principal Research Fellow

Samuel Raetz

ZAKHAR KUDRYNSKYI ZAKHAR.KUDRYNSKYI@NOTTINGHAM.AC.UK
Nottingham Research Anne Mclaren Fellows

Zakhar D. Kovalyuk

Nikolay Chigarev

ANTHONY KENT anthony.kent@nottingham.ac.uk
Professor of Physics

Vitalyi E. Gusev



Abstract

Although the topography of van de Waals (vdW) layers and heterostructures can be imaged by scanning probe microscopy, high-frequency interface elastic properties are more difficult to assess. These can influence the stability, reliability and performance of electronic devices that require uniform layers and interfaces. Here, we use picosecond ultrasonics to image these properties in vdW layers and heterostructures based on well-known exfoliable materials, i.e. InSe, hBN and graphene. We reveal a strong, uniform elastic coupling between vdW layers over a wide range of frequencies of up to tens of gigahertz (GHz) and in-plane areas of 100 _m2. In contrast, the vdW layers can be weakly coupled to their supporting substrate, behaving effectively as free standing membranes. Our data and analysis demonstrate that picosecond ultrasonics offers opportunities can probe the high-frequency elastic coupling of vdW nanolayers and image both perfect and broken interfaces between different materials over a wide frequency range, as required for future scientific and technological developments.

Citation

Greener, J. D., de Lima Savi, E., Akimov, A. V., Raetz, S., Kudrynskyi, Z., Kovalyuk, Z. D., …Gusev, V. E. (2019). High-Frequency Elastic Coupling at the Interface of van der Waals Nanolayers Imaged by Picosecond Ultrasonics. ACS Nano, 13(10), 11530-11537. https://doi.org/10.1021/acsnano.9b05052

Journal Article Type Article
Acceptance Date Sep 5, 2019
Online Publication Date Sep 5, 2019
Publication Date Oct 22, 2019
Deposit Date Sep 12, 2019
Publicly Available Date Mar 28, 2024
Journal ACS Nano
Print ISSN 1936-0851
Electronic ISSN 1936-086X
Publisher American Chemical Society
Peer Reviewed Peer Reviewed
Volume 13
Issue 10
Pages 11530-11537
DOI https://doi.org/10.1021/acsnano.9b05052
Keywords General Engineering; General Physics and Astronomy; General Materials Science
Public URL https://nottingham-repository.worktribe.com/output/2608443
Publisher URL https://pubs.acs.org/doi/abs/10.1021/acsnano.9b05052
Additional Information This document is the unedited Author’s version of a Submitted Work that was subsequently accepted for publication in ACS Nano, copyright ©American Chemical Society after peer review. To access the final edited and published work see https://pubs.acs.org/doi/abs/10.1021/acsnano.9b05052

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