OTA testing of near‐field and far‐field communication links

Korunur Engiz, B.; Lodro, M.; Greedy, S.; Thomas, D.W.P.

Abstract

In this work, near-field and far-field link measurement in metal enclosure environment is performed. The performance of near-field and far-field links are assessed using key performance indicators such as error vector magnitude, bit error rate, and signal-to-noise ratio. The metal enclosure is placed in an anechoic chamber, ensuring a stationary measurement environment. There are no external interference sources and the results are a function of near-field and far-field scenarios and hardware impairments. In measurements, software-defined radios used for the transmission and reception of image data using the long-term evolution-advanced physical layer. Based on the results of the study, an optimum gain region can be determined where better key performance indicators are achieved. Furthermore, the frequency selectivity of the channel is reduced within the determined optimum gain region, leading to an improvement in the system's performance.

Citation

Korunur Engiz, B., Lodro, M., Greedy, S., & Thomas, D. (2023). OTA testing of near‐field and far‐field communication links. Electronics Letters, 59(19), Article e12967. https://doi.org/10.1049/ell2.12967

• Journal Article Type: Article
• Acceptance Date: Sep 22, 2023
• Online Publication Date: Oct 3, 2023
• Publication Date: 2023-10
• Deposit Date: Mar 3, 2025
• Publicly Available Date: Mar 6, 2025
• Journal: Electronics Letters
• Print ISSN: 0013-5194
• Electronic ISSN: 1350-911X
• Publisher: Institution of Engineering and Technology (IET)
• Peer Reviewed: Peer Reviewed
• Volume: 59
• Issue: 19
• Article Number: e12967
• DOI: https://doi.org/10.1049/ell2.12967
• Keywords: Electrical and Electronic Engineering
• Public URL: https://nottingham-repository.worktribe.com/output/25953210
• Publisher URL: https://ietresearch.onlinelibrary.wiley.com/doi/10.1049/ell2.12967
• Additional Information: Received: 2023-07-09; Accepted: 2023-09-22; Published: 2023-10-03