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An Improved Three-Phase Buck Rectifier Topology with Reduced Voltage Stress on Transistors

Lei, Jiaxing; Feng, Shuang; Zhao, Jianfeng; Chen, Wu; Wheeler, Patrick; Shi, Mingming

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Authors

Jiaxing Lei

Shuang Feng

Jianfeng Zhao

Wu Chen

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PATRICK WHEELER pat.wheeler@nottingham.ac.uk
Professor of Power Electronic Systems

Mingming Shi



Abstract

The three-phase buck rectifier (3ph-BR) is suitable for applications where a voltage step down function is required. In this paper, an improved 3ph-BR topology is proposed to reduce the voltage stress on the transistors. The freewheeling diode in the conventional topology is split into two diodes in series and the input neutral point is connected to the common point of the two diodes. With the proposed topology and the correspondingly modified modulation scheme, the transistors only need to withstand the input phase voltage instead of the line-to-line voltage, bringing about the significant reduction of voltage stress. The proposed topology enables a more cost-efficient and flexible selection of the transistors. Experimental results have verified the validity of the modified topology and associated modulation scheme.

Citation

Lei, J., Feng, S., Zhao, J., Chen, W., Wheeler, P., & Shi, M. (2020). An Improved Three-Phase Buck Rectifier Topology with Reduced Voltage Stress on Transistors. IEEE Transactions on Power Electronics, 35(3), 2458-2466. https://doi.org/10.1109/tpel.2019.2931803

Journal Article Type Article
Acceptance Date Jul 26, 2019
Online Publication Date Jul 29, 2019
Publication Date Mar 1, 2020
Deposit Date Aug 13, 2019
Publicly Available Date Aug 14, 2019
Journal IEEE Transactions on Power Electronics
Print ISSN 0885-8993
Electronic ISSN 1941-0107
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 35
Issue 3
Pages 2458-2466
DOI https://doi.org/10.1109/tpel.2019.2931803
Keywords Electrical and Electronic Engineering
Public URL https://nottingham-repository.worktribe.com/output/2425451
Publisher URL https://ieeexplore.ieee.org/document/8779705
Additional Information © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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