Skip to main content

Research Repository

Advanced Search

Probing Graphene Defect Kinetics at Millisecond Time Resolution Using Direct Detection and Machine Learning

Huang, Chen; Allen, Christopher; Skowron, Stephen; Lobato, Ivan; Sasaki, Takeo; Van Aert, Sandra; Besley, Elena; Kirkland, Angus

Authors

Chen Huang

Christopher Allen

Stephen Skowron

Ivan Lobato

Takeo Sasaki

Sandra Van Aert

Angus Kirkland



Citation

Huang, C., Allen, C., Skowron, S., Lobato, I., Sasaki, T., Van Aert, S., Besley, E., & Kirkland, A. (2022). Probing Graphene Defect Kinetics at Millisecond Time Resolution Using Direct Detection and Machine Learning. Microscopy and Microanalysis, 28(S1), 1794-1796. https://doi.org/10.1017/s1431927622007097

Journal Article Type Article
Acceptance Date Aug 1, 2022
Online Publication Date Aug 1, 2022
Publication Date Aug 1, 2022
Deposit Date Mar 13, 2023
Journal Microscopy and Microanalysis
Print ISSN 1431-9276
Electronic ISSN 1435-8115
Publisher Cambridge University Press
Peer Reviewed Not Peer Reviewed
Volume 28
Issue S1
Pages 1794-1796
DOI https://doi.org/10.1017/s1431927622007097
Keywords Instrumentation
Public URL https://nottingham-repository.worktribe.com/output/17071614
Publisher URL https://academic.oup.com/mam/article-abstract/28/S1/1794/6995958?redirectedFrom=fulltext&login=false


You might also like



Downloadable Citations