Chen Huang
Probing Graphene Defect Kinetics at Millisecond Time Resolution Using Direct Detection and Machine Learning
Huang, Chen; Allen, Christopher; Skowron, Stephen; Lobato, Ivan; Sasaki, Takeo; Van Aert, Sandra; Besley, Elena; Kirkland, Angus
Authors
Christopher Allen
Stephen Skowron
Ivan Lobato
Takeo Sasaki
Sandra Van Aert
Professor ELENA BESLEY ELENA.BESLEY@NOTTINGHAM.AC.UK
Professor of Theoretical Computational Chemistry
Angus Kirkland
Citation
Huang, C., Allen, C., Skowron, S., Lobato, I., Sasaki, T., Van Aert, S., …Kirkland, A. (2022). Probing Graphene Defect Kinetics at Millisecond Time Resolution Using Direct Detection and Machine Learning. Microscopy and Microanalysis, 28(S1), 1794-1796. https://doi.org/10.1017/s1431927622007097
Journal Article Type | Article |
---|---|
Acceptance Date | Aug 1, 2022 |
Online Publication Date | Aug 1, 2022 |
Publication Date | Aug 1, 2022 |
Deposit Date | Mar 13, 2023 |
Journal | Microscopy and Microanalysis |
Print ISSN | 1431-9276 |
Electronic ISSN | 1435-8115 |
Publisher | Cambridge University Press |
Peer Reviewed | Not Peer Reviewed |
Volume | 28 |
Issue | S1 |
Pages | 1794-1796 |
DOI | https://doi.org/10.1017/s1431927622007097 |
Keywords | Instrumentation |
Public URL | https://nottingham-repository.worktribe.com/output/17071614 |
Publisher URL | https://academic.oup.com/mam/article-abstract/28/S1/1794/6995958?redirectedFrom=fulltext&login=false |
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