Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN
Moldovan, Grigore; Harrison, Ian; Roe, Martin; Brown, Paul D.
Paul D. Brown
A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KOH treatment, mirrored in a reduction in the magnitude of the EBIC current, even though the EBIC images look visibly unaltered. XPS demonstrates a modification in the surfaces states, e.g. resulting in a –0.3eV shift in the binding energy of Ga3d for MBE GaN following KOH processing.
|Publication Date||Jan 1, 2004|
|Peer Reviewed||Peer Reviewed|
|Series Title||Institute of Physics conference series|
|Book Title||Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003|
|APA6 Citation||Moldovan, G., Harrison, I., Roe, M., & Brown, P. D. (2004). Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN. In S. McVitie, & D. McComb (Eds.), Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003Institute of Physics Publishing|
|Related Public URLs||http://iopscience.iop.org/|
|Copyright Statement||Copyright information regarding this work can be found at the following address: http://eprints.nottingh.../end_user_agreement.pdf|
Copyright information regarding this work can be found at the following address: http://eprints.nottingham.ac.uk/end_user_agreement.pdf
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