3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling
(2015)
Journal Article
Bailey, J., Havelund, R., Shard, A. G., Gilmore, I. S., Alexander, M. R., Sharp, J. S., & Scurr, D. J. (2015). 3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling. ACS Applied Materials and Interfaces, 7(4), 2654-2659. https://doi.org/10.1021/am507663v
ToF-SIMS imaging with argon cluster sputter depth profiling has provided detailed insight into the three-dimensional (3D) chemical composition of a series of polymer multilayer structures. Depths of more than 15 μm were profiled in these samples whil... Read More about 3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling.