Christopher J. Hyde
Application of the Liu and Murakami damage model for creep crack growth predictions in power plant steels
Hyde, Christopher J.; Sun, Wei; Hyde, Thomas H.; Saber, Mohammed; Becker, Adib A.
Authors
Wei Sun
Thomas H. Hyde
Mohammed Saber
Adib A. Becker
Contributors
Jan Awrejcewicz
Editor
| Publication Date | Feb 12, 2014 |
|---|---|
| Publisher | InTech |
| Peer Reviewed | Peer Reviewed |
| Book Title | Computational and Numerical Simulations |
| ISBN | 9789535112204 |
| Institution Citation | Hyde, C. J., Sun, W., Hyde, T. . H., Saber, M., & Becker, A. A. (2014). Application of the Liu and Murakami damage model for creep crack growth predictions in power plant steels. In J. Awrejcewicz (Ed.), Computational and Numerical SimulationsInTech. doi:10.5772/57052 |
| DOI | https://doi.org/10.5772/57052 |
| Publisher URL | http://www.intechopen.com/books/computational-and-numerical-simulations/application-of-the-liu-and-murakami-damage-model-for-creep-crack-growth-predictions-in-power-plant-s |
| Copyright Statement | Copyright information regarding this work can be found at the following address: http://creativecommons.org/licenses/by/4.0 |
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Copyright Statement
Copyright information regarding this work can be found at the following address: http://creativecommons.org/licenses/by/4.0