Surface plasmon microscopic sensing with beam profile modulation
(2012)
Journal Article
Zhang, B., Pechprasarn, S., & Somekh, M. G. (2012). Surface plasmon microscopic sensing with beam profile modulation. Optics Express, 20(27), https://doi.org/10.1364/OE.20.028039
Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of... Read More about Surface plasmon microscopic sensing with beam profile modulation.