On Accelerated Degradation of DC-Link Film Capacitors and Data-based Lifetime Estimation

Pena-Quintal, Angel; Mustafa, Uvais; Gerada, Chris; Ahmed, Md Rishad

Abstract

Methods to address the lifetime of film capacitors are a new trend, which have come about due to the importance of control algorithms relying on the stability and the reliability of this passive device for controlling ever-increasing power with optimal power conversion efficiency in modern powertrains of electrical vehicles. Capacitance degradation over time is a key-parameter to determine the lifetime of an electric vehicle drive and to provide safety to the passengers. In this paper, a method to account for the degradation of film capacitors is presented considering a charge-and-discharge method at a steady temperature to better understand its capacitance and equivalent series resistor changing behaviour. The temperature of the capacitor is set at a maximum rated level (from the manufacturer information) to assess an accelerated degradation, to address the physics of failure for these film capacitors and to propose a lifetime estimation method for them.

Citation

Pena-Quintal, A., Mustafa, U., Gerada, C., & Ahmed, M. R. (2024). On Accelerated Degradation of DC-Link Film Capacitors and Data-based Lifetime Estimation. IEEE Access, 12, 177565-177575. https://doi.org/10.1109/access.2024.3474256

• Journal Article Type: Article
• Acceptance Date: Oct 4, 2024
• Online Publication Date: Oct 4, 2024
• Publication Date: Oct 18, 2024
• Deposit Date: Nov 18, 2024
• Publicly Available Date: Nov 19, 2024
• Journal: IEEE Access
• Electronic ISSN: 2169-3536
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 12
• Pages: 177565-177575
• DOI: https://doi.org/10.1109/access.2024.3474256
• Keywords: Lifetime estimation, film capacitor degradation, thermal stress, reliability
• Public URL: https://nottingham-repository.worktribe.com/output/40590448
• Publisher URL: https://ieeexplore.ieee.org/document/10705426