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Open-Switch Fault Diagnosis for Three-Phase AC-DC Power Converter with Park's Vector Method Considering Modulation Schemes

Guo, Feng; Yang, Tao; Bozhko, Serhiy; Wheeler, Patrick

Open-Switch Fault Diagnosis for Three-Phase AC-DC Power Converter with Park's Vector Method Considering Modulation Schemes Thumbnail


Authors

Feng Guo



Abstract

Open-switch fault accounts for large proportions among failures in power conversion system. Previously, fault defection methods are carried out by researches from transient period or circuit configuration with complicated algorithms. This paper reveals characteristics of single IGBT open-switch fault in rectifier from perspective of modulation scheme It presents that with a suitable modulation index and modulation scheme, current park's vector diagnosis method can become simple and effective for two-level three-phase AC-DC power converter. In that way, park's vector can be generalized for localizing faults in both inverter and rectifier.

Citation

Guo, F., Yang, T., Bozhko, S., & Wheeler, P. (2019, August). Open-Switch Fault Diagnosis for Three-Phase AC-DC Power Converter with Park's Vector Method Considering Modulation Schemes. Presented at 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), Toulouse, France

Presentation Conference Type Edited Proceedings
Conference Name 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)
Start Date Aug 27, 2019
End Date Aug 30, 2019
Acceptance Date Apr 27, 2019
Online Publication Date Aug 30, 2019
Publication Date Oct 14, 2019
Deposit Date Feb 6, 2020
Publicly Available Date Feb 10, 2020
Pages 405-411
Book Title Proceedings of the 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives
ISBN 978-1-7281-1833-8
DOI https://doi.org/10.1109/DEMPED.2019.8864839
Public URL https://nottingham-repository.worktribe.com/output/3908840
Publisher URL https://ieeexplore.ieee.org/document/8864839
Additional Information © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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