Feng Guo
Open-Switch Fault Diagnosis for Three-Phase AC-DC Power Converter with Park's Vector Method Considering Modulation Schemes
Guo, Feng; Yang, Tao; Bozhko, Serhiy; Wheeler, Patrick
Authors
Professor TAO YANG TAO.YANG@NOTTINGHAM.AC.UK
PROFESSOR OF AEROSPACE ELECTRICALSYSTEMS
Professor SERHIY BOZHKO serhiy.bozhko@nottingham.ac.uk
PROFESSOR OF AIRCRAFT ELECTRIC POWER SYSTEMS
Professor PATRICK WHEELER pat.wheeler@nottingham.ac.uk
PROFESSOR OF POWER ELECTRONIC SYSTEMS
Abstract
Open-switch fault accounts for large proportions among failures in power conversion system. Previously, fault defection methods are carried out by researches from transient period or circuit configuration with complicated algorithms. This paper reveals characteristics of single IGBT open-switch fault in rectifier from perspective of modulation scheme It presents that with a suitable modulation index and modulation scheme, current park's vector diagnosis method can become simple and effective for two-level three-phase AC-DC power converter. In that way, park's vector can be generalized for localizing faults in both inverter and rectifier.
Citation
Guo, F., Yang, T., Bozhko, S., & Wheeler, P. (2019, August). Open-Switch Fault Diagnosis for Three-Phase AC-DC Power Converter with Park's Vector Method Considering Modulation Schemes. Presented at 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), Toulouse, France
Presentation Conference Type | Edited Proceedings |
---|---|
Conference Name | 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) |
Start Date | Aug 27, 2019 |
End Date | Aug 30, 2019 |
Acceptance Date | Apr 27, 2019 |
Online Publication Date | Aug 30, 2019 |
Publication Date | Oct 14, 2019 |
Deposit Date | Feb 6, 2020 |
Publicly Available Date | Feb 10, 2020 |
Pages | 405-411 |
Book Title | Proceedings of the 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives |
ISBN | 978-1-7281-1833-8 |
DOI | https://doi.org/10.1109/DEMPED.2019.8864839 |
Public URL | https://nottingham-repository.worktribe.com/output/3908840 |
Publisher URL | https://ieeexplore.ieee.org/document/8864839 |
Additional Information | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
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