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Metasurface Optics With On-Axis Polarization Control for Terahertz Sensing Applications

Nowack, Thomas S.; Shah, Yash D.; Grant, James P.; Carranza, Ivonne Escorcia; Kenney, Mitchell G.; Faccio, Daniele; Wasige, Edward; Cumming, David R. S.

Authors

Thomas S. Nowack

Yash D. Shah

James P. Grant

Ivonne Escorcia Carranza

Daniele Faccio

Edward Wasige

David R. S. Cumming



Abstract

Nondestructive testing (NDT) and imaging of materials with unknown properties are important applications of terahertz technology. Different contrast-forming methods are available to obtain diverse information on the imaged region, including intensity, color, phase, and polarization. Polarimetric imaging is relatively under-investigated owing to the difficulty in its implementation with complex optical arrangements. In this article, we present the design and monolithic fabrication of an anisotropic metasurface that incorporates several beam-forming functions in a single layer with high efficiency thus simplifying instrument construction. The probe beam generated by the metasurface consists of an orthogonally polarized pair of collinear Bessel beams that create a well-defined on-axis change of polarization. The metasurface is integrated into a polarimetric imaging microscope for 3-D beam profiling and sensing experiments at 2.52 THz. An analytical model to describe the on-axis polarization variation was found to be in excellent agreement with both finite-difference time-domain (FDTD) simulations and the experimental results. The setup was used to measure the refractive index and diattenuation of homogeneous sample regions in a proof-of-principle application. We anticipate this technology will find future applications in NDT and polarimetric imaging of polymer composites and 3-D profilometry of reflective surfaces.

Citation

Nowack, T. S., Shah, Y. D., Grant, J. P., Carranza, I. E., Kenney, M. G., Faccio, D., Wasige, E., & Cumming, D. R. S. (2023). Metasurface Optics With On-Axis Polarization Control for Terahertz Sensing Applications. IEEE Transactions on Terahertz Science & Technology, 13(4), 373-380. https://doi.org/10.1109/TTHZ.2023.3263648

Journal Article Type Article
Acceptance Date Feb 23, 2023
Online Publication Date Mar 31, 2023
Publication Date 2023-07
Deposit Date Nov 8, 2023
Journal IEEE Transactions on Terahertz Science and Technology
Print ISSN 2156-342X
Electronic ISSN 2156-3446
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 13
Issue 4
Pages 373-380
DOI https://doi.org/10.1109/TTHZ.2023.3263648
Keywords Electrical and Electronic Engineering; Radiation
Public URL https://nottingham-repository.worktribe.com/output/22726815
Publisher URL https://ieeexplore.ieee.org/document/10089514