Y.A. Al-Aufi
Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques
Al-Aufi, Y.A.; Hewakandamby, B.N.; Dimitrakis, G.; Holmes, M.; Hasan, A.; Watson, N.J.
Authors
Dr BUDDHIKA HEWAKANDAMBY BUDDHIKA.HEWAKANDAMBY@NOTTINGHAM.AC.UK
ASSOCIATE PROFESSOR
Dr GEORGIOS DIMITRAKIS GEORGIOS.DIMITRAKIS@NOTTINGHAM.AC.UK
ASSOCIATE PROFESSOR
M. Holmes
A. Hasan
N.J. Watson
Citation
Al-Aufi, Y., Hewakandamby, B., Dimitrakis, G., Holmes, M., Hasan, A., & Watson, N. (2019). Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques. Flow Measurement and Instrumentation, 66, 67-78. https://doi.org/10.1016/j.flowmeasinst.2019.02.008
Journal Article Type | Article |
---|---|
Acceptance Date | Feb 16, 2019 |
Online Publication Date | Feb 25, 2019 |
Publication Date | 2019-04 |
Deposit Date | Mar 4, 2019 |
Publicly Available Date | Mar 5, 2019 |
Journal | Flow Measurement and Instrumentation |
Print ISSN | 0955-5986 |
Electronic ISSN | 1873-6998 |
Publisher | Elsevier |
Peer Reviewed | Peer Reviewed |
Volume | 66 |
Pages | 67-78 |
DOI | https://doi.org/10.1016/j.flowmeasinst.2019.02.008 |
Keywords | Modelling and Simulation; Instrumentation; Electrical and Electronic Engineering; Computer Science Applications |
Public URL | https://nottingham-repository.worktribe.com/output/1604456 |
Publisher URL | https://www.sciencedirect.com/science/article/pii/S0955598618302437 |
Additional Information | This article is maintained by: Elsevier; Article Title: Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques; Journal Title: Flow Measurement and Instrumentation; CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.flowmeasinst.2019.02.008; Content Type: article; Copyright: © 2019 Elsevier Ltd. All rights reserved. |
Contract Date | Mar 5, 2019 |
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