Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques

Al-Aufi, Y.A.; Hewakandamby, B.N.; Dimitrakis, G.; Holmes, M.; Hasan, A.; Watson, N.J.

doi:10.1016/j.flowmeasinst.2019.02.008

Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques

Al-Aufi, Y.A.; Hewakandamby, B.N.; Dimitrakis, G.; Holmes, M.; Hasan, A.; Watson, N.J.

Authors

Y.A. Al-Aufi

Dr BUDDHIKA HEWAKANDAMBY BUDDHIKA.HEWAKANDAMBY@NOTTINGHAM.AC.UK
Associate Professor

GEORGIOS DIMITRAKIS GEORGIOS.DIMITRAKIS@NOTTINGHAM.AC.UK
Associate Professor

M. Holmes

A. Hasan

N.J. Watson

Citation

Al-Aufi, Y., Hewakandamby, B., Dimitrakis, G., Holmes, M., Hasan, A., & Watson, N. (2019). Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques. Flow Measurement and Instrumentation, 66, 67-78. https://doi.org/10.1016/j.flowmeasinst.2019.02.008

Journal Article Type	Article
Acceptance Date	Feb 16, 2019
Online Publication Date	Feb 25, 2019
Publication Date	2019-04
Deposit Date	Mar 4, 2019
Publicly Available Date	Mar 5, 2019
Journal	Flow Measurement and Instrumentation
Print ISSN	0955-5986
Publisher	Elsevier
Peer Reviewed	Peer Reviewed
Volume	66
Pages	67-78
DOI	https://doi.org/10.1016/j.flowmeasinst.2019.02.008
Keywords	Modelling and Simulation; Instrumentation; Electrical and Electronic Engineering; Computer Science Applications
Public URL	https://nottingham-repository.worktribe.com/output/1604456
Publisher URL	https://www.sciencedirect.com/science/article/pii/S0955598618302437
Additional Information	This article is maintained by: Elsevier; Article Title: Thin film thickness measurements in two phase annular flows using ultrasonic pulse echo techniques; Journal Title: Flow Measurement and Instrumentation; CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.flowmeasinst.2019.02.008; Content Type: article; Copyright: © 2019 Elsevier Ltd. All rights reserved.