CP Martin
Controlling Pattern Formation in Nanoparticle Assemblies via Directed Solvent Dewetting
Martin, CP; Blunt, MO; Pauliac-Vaujour, E; Stannard, A; Moriarty, P; Vancea, I; Thiele, U
Authors
MO Blunt
E Pauliac-Vaujour
A Stannard
P Moriarty
I Vancea
U Thiele
Abstract
We have achieved highly localised control of pattern formation in two dimensional nanoparticle assemblies by direct modification of solvent dewetting dynamics. A striking dependence of nanoparticle organisation on the size of atomic force microscope-generated surface heterogeneities is observed and reproduced in numerical simulations. Nanoscale features induce rupture of the solvent-nanoparticle film, causing the local flow of solvent to carry nanoparticles into confinement. Microscale heterogeneities instead slow the evaporation of the solvent, producing a remarkably abrupt interface
between different nanoparticle patterns.
Citation
Martin, C., Blunt, M., Pauliac-Vaujour, E., Stannard, A., Moriarty, P., Vancea, I., & Thiele, U. (2007). Controlling Pattern Formation in Nanoparticle Assemblies via Directed Solvent Dewetting. Physical Review Letters, 99,
Journal Article Type | Article |
---|---|
Publication Date | Sep 1, 2007 |
Deposit Date | Jun 5, 2008 |
Publicly Available Date | Jun 5, 2008 |
Journal | Physical Review Letters |
Print ISSN | 0031-9007 |
Publisher | American Physical Society |
Peer Reviewed | Peer Reviewed |
Volume | 99 |
Keywords | nanoparticles; self-assembly; self-organisation; dewetting; nanostructures; pattern formation |
Public URL | https://nottingham-repository.worktribe.com/output/1016597 |
Publisher URL | http://scitation.aip.org |
Related Public URLs | http://www.nottingham.ac.uk/physics/research/nano |
Additional Information | Copyright of American Physical Society |
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