Outputs (2)

Benchmarking TERS and TEPL probes: towards a reference sample for quantification of near-field enhancement factors in gap and non-gap modes (2025)
Journal Article
Kerfoot, J., Legge, E. J., Collins, A., Chauhan, J., Rossnagel, K., H. Beton, P., Mellor, C. J., Pollard, A. J., Rance, G. A., & W. George, M. (2025). Benchmarking TERS and TEPL probes: towards a reference sample for quantification of near-field enhancement factors in gap and non-gap modes. Analyst, https://doi.org/10.1039/D5AN00456J

Benchmarking the near-field signal enhancement attained using plasmonic metal-coated atomic force microscopy (AFM) probes for tip-enhanced Raman spectroscopy (TERS) and tip-enhanced photoluminescence (TEPL) measurements is challenging given the absen... Read More about Benchmarking TERS and TEPL probes: towards a reference sample for quantification of near-field enhancement factors in gap and non-gap modes.

Imaging the photophysics of organic semiconductors using polarisation-resolved and near-field optical spectroscopies (2025)
Journal Article
Kerfoot, J., James, T., Taniguchi, T., Watanabe, K., Beton, P. H., Rance, G. A., & George, M. W. (2025). Imaging the photophysics of organic semiconductors using polarisation-resolved and near-field optical spectroscopies. Optics Communications, 588, Article 131945. https://doi.org/10.1016/j.optcom.2025.131945

Imaging techniques that enable the structure of organic semiconductors to be determined across length scales are essential for optimisation of their luminescence properties. In this study, we prepare well-ordered monolayer films of perylene-3,4,9,10-... Read More about Imaging the photophysics of organic semiconductors using polarisation-resolved and near-field optical spectroscopies.