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Comparison of power cycling reliability of flexible PCB interconnect smaller/thinner and larger/thicker power devices with topside Sn-3.5Ag solder joints (2018)
Journal Article
Li, J., Dai, J., & Johnson, C. M. (2018). Comparison of power cycling reliability of flexible PCB interconnect smaller/thinner and larger/thicker power devices with topside Sn-3.5Ag solder joints. Microelectronics Reliability, 84, 55-65. https://doi.org/10.1016/j.microrel.2018.03.013

The power cycling reliability of flexible printed circuit board (PCB) interconnect smaller/thinner (ST) 9.5 mm × 5.5 mm × 0.07 mm and larger/thicker (LT) 13.5 mm × 13.5 mm × 0.5 mm single Si diode samples have been studied. With the assumption of cre... Read More about Comparison of power cycling reliability of flexible PCB interconnect smaller/thinner and larger/thicker power devices with topside Sn-3.5Ag solder joints.

Electrical Performance and Reliability Characterization of a SiC MOSFET Power Module With Embedded Decoupling Capacitors (2018)
Journal Article
O Brien, J., Yang, L., Li, K., Dai, J., Corfield, M., Harris, A., …Johnson, C. M. (2018). Electrical Performance and Reliability Characterization of a SiC MOSFET Power Module With Embedded Decoupling Capacitors. IEEE Transactions on Power Electronics, 33(12), 10594-10601. https://doi.org/10.1109/TPEL.2018.2809923

Integration of decoupling capacitors in SiC MOSFET modules is an advanced solution to mitigate the effect of parasitic inductance induced by module assembly interconnects. In this paper, the switching transient behavior is reported for a 1.2kV SiC MO... Read More about Electrical Performance and Reliability Characterization of a SiC MOSFET Power Module With Embedded Decoupling Capacitors.

Improved Reliability of Planar Power Interconnect With Ceramic-Based Structure (2017)
Journal Article
Zhang, H., Li, J., Dai, J., Corfield, M., Liu, X., Liu, Y., …Johnson, C. M. (2018). Improved Reliability of Planar Power Interconnect With Ceramic-Based Structure. IEEE Journal of Emerging and Selected Topics in Power Electronics, 6(1), 175-187. https://doi.org/10.1109/jestpe.2017.2758901

This paper proposes an advanced Si3N4 ceramic-based structure with through vias designed and filled with brazing alloy as a reliable interconnect solution in planar power modules. Finite element (FE) modeling and simulation were first used to predict... Read More about Improved Reliability of Planar Power Interconnect With Ceramic-Based Structure.

A study on probability of distribution loads based on expectation maximization algorithm (2017)
Conference Proceeding
Ganjavi, A., Christopher, E., Johnson, C. M., & Clare, J. (2017). A study on probability of distribution loads based on expectation maximization algorithm. In IEEE Power and Energy Society Innovative Smart Grid Technologies Conference, ISGT 2017 (1-5). https://doi.org/10.1109/ISGT.2017.8086037

In a distribution power network, the load model has no certain pattern or predicted behaviour due to large range of data and changes in energy consumption for end-user consumers. Thus, a powerful analysis based on probabilistic structure is required.... Read More about A study on probability of distribution loads based on expectation maximization algorithm.

Time-Efficient Sintering Processes to Attach Power Devices Using Nanosilver Dry Film (2017)
Journal Article
Dai, J., Li, J., Agyakwa, P., & Johnson, C. M. (2017). Time-Efficient Sintering Processes to Attach Power Devices Using Nanosilver Dry Film. Journal of Microelectronics and Electronic Packaging, 14(4), 140-149. https://doi.org/10.4071/imaps.521776

Pressure-assisted sintering processes to attach power devices using wet nanosilver pastes with time scales of minutes to a few hours have been widely reported. This paper presents our work on time-efficient sintering, using nanosilver dry film and an... Read More about Time-Efficient Sintering Processes to Attach Power Devices Using Nanosilver Dry Film.

Characterisation and modelling of gallium nitride power semiconductor devices dynamic on-state resistance (2017)
Journal Article
Li, K., Evans, P., & Johnson, M. (2018). Characterisation and modelling of gallium nitride power semiconductor devices dynamic on-state resistance. IEEE Transactions on Power Electronics, 33(6), 5262 - 5273. https://doi.org/10.1109/TPEL.2017.2730260

GaN-HEMTs suffer from trapping effects which increases device ON-state resistance (RDS(on)) above its theoretical value. This increase is a function of the applied DC bias when the device is in its OFF state, and the time which the device is biased f... Read More about Characterisation and modelling of gallium nitride power semiconductor devices dynamic on-state resistance.

Design and development of a high-density, high-speed 10 kV SiC MOSFET module (2017)
Conference Proceeding
Di Marino, C., Boroyevich, D., Burgos, R., Johnson, C. M., & Lu, G. (2017). Design and development of a high-density, high-speed 10 kV SiC MOSFET module.

High-density packaging of fast-switching power semiconductors typically requires low parasitic inductance, high heat extraction, and high thermo-mechanical reliability. High-density packaging of high-voltage power semiconductors, such as 10 kV SiC MO... Read More about Design and development of a high-density, high-speed 10 kV SiC MOSFET module.

A new analysis for finding the optimum power rating of low voltage distribution power electronics based on statistics and probabilities (2017)
Conference Proceeding
Ganjavi, A., Christopher, E., Johnson, C. M., & Clare, J. C. (2017). A new analysis for finding the optimum power rating of low voltage distribution power electronics based on statistics and probabilities.

The continuing trend toward heavier load and high penetration of Distribution Generation (DG) units in low voltage rural distribution feeders requires power electronic-based solution alternatives for voltage regulation purposes. The design of power e... Read More about A new analysis for finding the optimum power rating of low voltage distribution power electronics based on statistics and probabilities.

SiC/GaN power semiconductor devices: a theoretical comparison and experimental evaluation under different switching conditions (2017)
Journal Article
Li, K., Evans, P., & Johnson, M. (in press). SiC/GaN power semiconductor devices: a theoretical comparison and experimental evaluation under different switching conditions. IET Electrical Systems in Transportation, https://doi.org/10.1049/iet-est.2017.0022

The conduction and switching losses of SiC and GaN power transistors are compared in this paper. Voltage rating of commercial GaN power transistors is less than 650V while that of SiC power transistors is less than 1200V. The paper begins with a theo... Read More about SiC/GaN power semiconductor devices: a theoretical comparison and experimental evaluation under different switching conditions.

Using multi time-scale electro-thermal simulation approach to evaluate SiC-MOSFET power C=converter in virtual prototyping design tool (2017)
Conference Proceeding
Li, K., Evans, P., & Johnson, C. M. (in press). Using multi time-scale electro-thermal simulation approach to evaluate SiC-MOSFET power C=converter in virtual prototyping design tool.

Using virtual prototyping (VP) design tool to eval¬uate power converter electro-thermal performance can help designers to validate prototype in a quick way. However, different system time-scale requires efficient electro-thermal simulation techniques... Read More about Using multi time-scale electro-thermal simulation approach to evaluate SiC-MOSFET power C=converter in virtual prototyping design tool.

Time-efficient sintering processes to attach power devices using nanosilver dry film (2017)
Journal Article
Dai, J., Li, J., Agyakwa, P., & Mark Johnson, C. (2017). Time-efficient sintering processes to attach power devices using nanosilver dry film. Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT), 2017(HiTEN), 000207–000212. https://doi.org/10.4071/2380-4491.2017.hiten.207

Pressure-assisted sintering processes to attach power devices using wet nanosilver pastes with time scales of minutes to a few hours have been widely reported. This paper presents our work on time-efficient sintering, using nanosilver dry film and an... Read More about Time-efficient sintering processes to attach power devices using nanosilver dry film.

Highly-integrated power cell for high-power wide band-gap power converters (2017)
Conference Proceeding
Espina, J., Ahmadi, B., Empringham, L., De Lillo, L., & Johnson, C. M. (2017). Highly-integrated power cell for high-power wide band-gap power converters.

The fast switching speeds and low specific conduction losses of wide band-gap semiconductors allow the realisation of high-frequency, high power-density switching converters with dramatically reduced passive component requirements compared to Silicon... Read More about Highly-integrated power cell for high-power wide band-gap power converters.

Design and construction of a co-planar power bus interconnect for low inductance switching (2017)
Conference Proceeding
Lin, X., Li, J., & Johnson, M. (2017). Design and construction of a co-planar power bus interconnect for low inductance switching. In 2017 IEEE International Workshop On Integrated Power Packaging (IWIPP) (1-4). https://doi.org/10.1109/IWIPP.2017.7936755

A co-planar tab-slot type of interconnect demonstrator for connecting power switching devices and DC bus capacitors has been designed and constructed, aimed at low inductance switching. The demonstrator is composed of a double-sided tab connector and... Read More about Design and construction of a co-planar power bus interconnect for low inductance switching.

A Physical RC Network Model for Electrothermal Analysis of a Multichip SiC Power Module (2017)
Journal Article
Li, J., Castellazzi, A., Eleffendi, M. A., Gurpinar, E., Johnson, C. M., & Mills, L. (2018). A Physical RC Network Model for Electrothermal Analysis of a Multichip SiC Power Module. IEEE Transactions on Power Electronics, 33(3), 2494-2508. https://doi.org/10.1109/TPEL.2017.2697959

© 2017 IEEE. This paper is concerned with the thermal models which can physically reflect the heat-flow paths in a lightweight three-phase half-bridge two-level SiC power module with six MOSFETs and can be used for coupled electrothermal simulation.... Read More about A Physical RC Network Model for Electrothermal Analysis of a Multichip SiC Power Module.

Interconnect materials enabling IGBT modules to achieve stable short circuit failure behavior (2017)
Journal Article
Li, J., Yaqub, I., Corfield, M., & Johnson, C. M. (2017). Interconnect materials enabling IGBT modules to achieve stable short circuit failure behavior. IEEE Transactions on Components, Packaging, and Manufacturing Technology, 7(5), 734-744. https://doi.org/10.1109/TCPMT.2017.2683202

Insulated gate bipolar transistor (IGBT) modules, which can fail to stable short-circuit mode, have major applications in electricity network-related fields. Sn-3.5Ag solder joints and sintered Ag joints for the die attachment and Mo, Cu, Sn-3.5Ag, A... Read More about Interconnect materials enabling IGBT modules to achieve stable short circuit failure behavior.

Suppression of electromagnetic interference using screening and shielding techniques within switching cells (2017)
Conference Proceeding
Zhang, Z., & Johnson, C. M. (2017). Suppression of electromagnetic interference using screening and shielding techniques within switching cells.

in this paper we introduce the use of combination of screening and shielding to suppress electromagnetic interference (EMI) generated by a switching cell. We investigate the screening of common mode (CM) currents and the shielding of magnetic fields... Read More about Suppression of electromagnetic interference using screening and shielding techniques within switching cells.

In-Service Diagnostics for Wire-Bond Lift-off and Solder Fatigue of Power Semiconductor Packages (2017)
Journal Article
Eleffendi, M. A., & Johnson, C. M. (2017). In-Service Diagnostics for Wire-Bond Lift-off and Solder Fatigue of Power Semiconductor Packages. IEEE Transactions on Power Electronics, 32(9), 7187-7198. https://doi.org/10.1109/TPEL.2016.2628705

Wire-bond lift-off and Solder fatigue are degradation mechanisms that dominate the lifetime of power semiconductor packages. Although their lifetime is commonly estimated at the design stage, based on mission profiles and Physics-of-Failure models, t... Read More about In-Service Diagnostics for Wire-Bond Lift-off and Solder Fatigue of Power Semiconductor Packages.

SiC and GaN power transistors switching energy evaluation in hard and soft switching conditions (2016)
Conference Proceeding
Li, K., Evans, P., & Johnson, C. M. (2016). SiC and GaN power transistors switching energy evaluation in hard and soft switching conditions.

SiC and GaN power transistors switching energy are compared in this paper. In order to compare switching energy Esw of the same power rating device, a theoretical analysis is given to compare SiC device conduction loss and switching losses change whe... Read More about SiC and GaN power transistors switching energy evaluation in hard and soft switching conditions.

A novel full soft-switching resonant power converter for mid-feeder voltage regulation of low voltage distribution network (2016)
Conference Proceeding
Ji, C., Watson, A. J., Clare, J. C., & Johnson, C. M. (2016). A novel full soft-switching resonant power converter for mid-feeder voltage regulation of low voltage distribution network. In 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe) (1-6). https://doi.org/10.1109/EPE.2016.7695398

This paper presents a novel resonant based, high power density power electronics converter solution for mid-feeder voltage regulation of a low voltage (LV) distribution network. Owing to the use of high switching frequency operation and a full soft-s... Read More about A novel full soft-switching resonant power converter for mid-feeder voltage regulation of low voltage distribution network.

SiC/GaN power semiconductor devices theoretical comparison and experimental evaluation (2016)
Conference Proceeding
Li, K., Evans, P., & Johnson, C. M. (2016). SiC/GaN power semiconductor devices theoretical comparison and experimental evaluation.

SiC and GaN power transistors conduction loss and switching losses are compared in this paper. In order to compare performance of the same power rating device, a theoretical analysis is given to compare SiC device conduction loss and switching losses... Read More about SiC/GaN power semiconductor devices theoretical comparison and experimental evaluation.