All Outputs (5)

Structural characterisation of carbon nanotubes in the presence of a Ni catalyst (2004)
Book Chapter
Edwards, H., Fay, M. W., Bououdina, M., Gregory, D., Walker, G., & Brown, P. D. (2004). Structural characterisation of carbon nanotubes in the presence of a Ni catalyst. In S. McVitie, & D. McComb (Eds.), Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics Publishing

Multi-wall carbon nanotubes (MWNTs) grown by chemical vapour deposition (CVD) of an ethene / hydrogen gas mixture on alumina supported and unsupported nickel catalysts for 10, 20 and 120 minutes at 600oC and 700oC are compared. Nano-scale nickel part... Read More about Structural characterisation of carbon nanotubes in the presence of a Ni catalyst.

TEM assessment of As-doped GaN epitaxial layers grown on sapphire (2004)
Book Chapter
Fay, M. W., Harrison, I., Larkins, E. C., Novikov, S. V., Foxon, C., & Brown, P. D. (2004). TEM assessment of As-doped GaN epitaxial layers grown on sapphire. In S. McVitie, & D. McComb (Eds.), Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003 (23-26). Institute of Physics Publishing

TEM investigations of As-doped GaN layers grown by plasma-assisted molecular beam epitaxy on sapphire substrates reveal the presence of extensive regions of cubic stacking disorder within the hexagonal GaN matrix. Electron energy loss spectroscopy su... Read More about TEM assessment of As-doped GaN epitaxial layers grown on sapphire.

Characterisation of dispersions within annealed HVOLF thermally sprayed AlSnCu coatings (2004)
Book Chapter
Kong, C., Moldovan, G., Fay, M. W., McCartney, D. G., & Brown, P. D. (2004). Characterisation of dispersions within annealed HVOLF thermally sprayed AlSnCu coatings. In S. McVitie, & D. McComb (Eds.), Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics Publishing

High velocity oxy-liquid fuel (HVOLF) AlSnCu coatings are characterised following annealing for up to 5 hours at 300°C. A combination of statistical analysis of BSE images and TEM observations demonstrate the decrease in the number of sub-micron and... Read More about Characterisation of dispersions within annealed HVOLF thermally sprayed AlSnCu coatings.

The application of tripod polishing and focused ion beam milling to the TEM specimen preparation of HVOF thermally sprayed coatings (2004)
Book Chapter
Kong, G., McCartney, D. G., & Brown, P. D. (2004). The application of tripod polishing and focused ion beam milling to the TEM specimen preparation of HVOF thermally sprayed coatings. In S. McVitie, & D. McComb (Eds.), Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics Publishing

The microstructure of high velocity oxy fuel thermally sprayed coatings is highly anisotropic and inhomogeneous. Tripod polishing has enabled the preparation of samples with up to 0.5mm diameter electron transparent areas, where a statistically signi... Read More about The application of tripod polishing and focused ion beam milling to the TEM specimen preparation of HVOF thermally sprayed coatings.

Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN (2004)
Book Chapter
Moldovan, G., Harrison, I., Roe, M., & Brown, P. D. (2004). Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN. In S. McVitie, & D. McComb (Eds.), Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics Publishing

A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KO... Read More about Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN.