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All Outputs (6)

Measurement noise of a point autofocus surface topography instrument (2017)
Conference Proceeding
Feng, X., Quagliotti, D., Maculotti, G., Syam, W. P., Tosello, G., Hansen, H. N., …Leach, R. (2017). Measurement noise of a point autofocus surface topography instrument.

Optical instruments for areal topography measurement can be especially sensitive to noise when scanning is required. Such noise has different sources, including those internally generated and external sources from the environment [1].For some instrum... Read More about Measurement noise of a point autofocus surface topography instrument.

Optical difference engine for defect inspection in highly-parallel manufacturing processes (2017)
Conference Proceeding
Feng, X., Su, R., Liu, M., & Leach, R. K. (2017). Optical difference engine for defect inspection in highly-parallel manufacturing processes.

Traditional defect inspection for highly-parallel manufacturing processes requires the processing of large measurement datasets, which is often not fast enough for in-situ inspection of large areas with high resolution. This study develops an all-opt... Read More about Optical difference engine for defect inspection in highly-parallel manufacturing processes.

Contamination of µCMM stylus tips: on-machine inspection (2016)
Conference Proceeding
Feng, X., Lacorne, C., Fernandes, G. Q., Lawes, S., & Kinnell, P. (2016). Contamination of µCMM stylus tips: on-machine inspection.

Contamination adhered to the surface of a µCMM stylus tip significantly impairs the dimensional accuracy of a µCMM system. Regular cleaning of the stylus is essential to minimising the dimensional error but little data exists for determining appropri... Read More about Contamination of µCMM stylus tips: on-machine inspection.

The development of a snow cleaning system for micro-CMM stylus tips (2015)
Conference Proceeding
Feng, X., Lawes, S., & Kinnell, P. K. (2015). The development of a snow cleaning system for micro-CMM stylus tips.

Contamination adhered to the surface of a µCMM stylus tip significantly impairs the dimensional accuracy of the CMM systems, potentially causing dimensional errors that are over ten times larger than the uncertainty of a modern µCMM. To reduce such e... Read More about The development of a snow cleaning system for micro-CMM stylus tips.

Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips (2015)
Conference Proceeding
Feng, X., Lawes, S., & Kinnell, P. K. (2015). Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips.

The dimensional accuracy of a micro-CMM is significantly affected by contamination adhered to the stylus tip during use. Contaminant particles can cause dimensional errors that are orders of magnitude greater than those reported in the literature. To... Read More about Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips.