Skip to main content

Research Repository

Advanced Search

All Outputs (1)

Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN (2004)
Book Chapter
Moldovan, G., Harrison, I., Roe, M., & Brown, P. D. (2004). Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN. In S. McVitie, & D. McComb (Eds.), Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics Publishing

A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KO... Read More about Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN.