Research Repository

See what's under the surface


GA based adaptive singularity-robust path planning of space robot for on-orbit detection (2018)
Journal Article
Wu, J., Bin, D., Feng, X., Wen, Z., & Zhang, Y. (2018). GA based adaptive singularity-robust path planning of space robot for on-orbit detection. Complexity, 2018, doi:10.1155/2018/3702916. ISSN 1076-2787

As a new on-orbit detection platform, the space robot could ensure stable and reliable operation of spacecraft in complex space environments. The tracking accuracy of the space manipulator end-effector is crucial to the detection precision. In this p... Read More

Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing (2018)
Journal Article
Feng, X., Su, R., Happonen, T., Liu, J., & Leach, R. (2018). Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing. Optics Express, 26(11), doi:10.1364/OE.26.013927. ISSN 1094-4087

This paper presents an all-optical difference engine (AODE) sensor for detecting the defects in printed electronics produced with roll-to-roll processes. The sensor is based on the principle of coherent optical subtraction and is able to achieve high... Read More

A self-calibration rotational stitching method for precision measurement of revolving surfaces (2018)
Journal Article
Liu, M., Cheung, C., Feng, X., Wang, C., & Leach, R. (in press). A self-calibration rotational stitching method for precision measurement of revolving surfaces. Precision Engineering, doi:10.1016/j.precisioneng.2018.05.002. ISSN 0141-6359

When measuring revolving objects, it is often desired to obtain not only the geometrical form of the workpiece, but also the topography of the surface, as they both affect the performance of the part. However, holistic measurement of the entire three... Read More

Hierarchical-information-based characterization of multiscale structured surfaces (2018)
Journal Article
Cheung, C. F., Liu, M., Leach, R., Feng, X., & Zhao, C. (2018). Hierarchical-information-based characterization of multiscale structured surfaces. CIRP Annals - Manufacturing Technology, 67(1), doi:10.1016/j.cirp.2018.04.002. ISSN 0007-8506

This paper presents a hierarchical-information-based characterization method for multiscale structured surfaces. The method makes use of a priori information of the multiscale surface and a hierarchical segmentation-registration (HSR) algorithm to fi... Read More

Noise evaluation of a point autofocus surface topography measuring instrument (2018)
Journal Article
Maculotti, G., Feng, X., Galetto, M., & Leach, R. K. (2018). Noise evaluation of a point autofocus surface topography measuring instrument. Measurement Science and Technology, 29(6), doi:10.1088/1361-6501/aab528. ISSN 0957-0233

In this work, the measurement noise of a point autofocus surface topography measuring instrument is evaluated, as the first step towards establishing a route to traceability for this type of instrument. The evaluation is based on the determination of... Read More

Manufacturing-error-based maintenance for high-precision machine tools (2017)
Journal Article
Shi, S., Lin, J., Xu, X., Feng, X., & Piano, S. (2018). Manufacturing-error-based maintenance for high-precision machine tools. International Journal of Advanced Manufacturing Technology, 95(1-4), doi:10.1007/s00170-017-1070-y. ISSN 0268-3768

Nowadays, the condition-based maintenance (CBM), in which repairs are triggered by the heuristic symptoms of the component faults, is finding increasing applications in the industrial fields. However, for the high-precision machine tools, the convent... Read More

A microscopy approach for in situ inspection of the μCMM stylus for contamination (2017)
Journal Article
Feng, X., Pascal, J., & Lawes, S. (in press). A microscopy approach for in situ inspection of the μCMM stylus for contamination. Measurement Science and Technology, 28(9), doi:10.1088/1361-6501/aa7c93. ISSN 0957-0233

During the µCMM measurement process, contamination gradually builds up on the surface of the stylus tip and affects dimensional accuracy of the measurement. Regular inspection of the stylus for contamination is essential in determining the appropriat... Read More

Measurement noise of a point autofocus surface topography instrument (2017)
Conference Proceeding
Feng, X., Quagliotti, D., Maculotti, G., Syam, W. P., Tosello, G., Hansen, H. N., …Leach, R. (2017). Measurement noise of a point autofocus surface topography instrument

Optical instruments for areal topography measurement can be especially sensitive to noise when scanning is required. Such noise has different sources, including those internally generated and external sources from the environment [1].For some instrum... Read More

Optical difference engine for defect inspection in highly-parallel manufacturing processes (2017)
Conference Proceeding
Feng, X., Su, R., Liu, M., & Leach, R. K. (2017). Optical difference engine for defect inspection in highly-parallel manufacturing processes

Traditional defect inspection for highly-parallel manufacturing processes requires the processing of large measurement datasets, which is often not fast enough for in-situ inspection of large areas with high resolution. This study develops an all-opt... Read More

Development of CO2 snow cleaning for in situ cleaning of µCMM stylus tips (2016)
Journal Article
Feng, X., Kinnell, P. K., & Lawes, S. (in press). Development of CO2 snow cleaning for in situ cleaning of µCMM stylus tips. Measurement Science and Technology, 28(1), doi:10.1088/1361-6501/28/1/015007. ISSN 0957-0233

Contamination adhered to the surface of a µCMM stylus tip compromises the measurement accuracy of the µCMM system, potentially causing dimensional errors that are over ten times larger than the uncertainty of a modern µCMM. In prior work by the autho... Read More

Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips (2015)
Conference Proceeding
Feng, X., Lawes, S., & Kinnell, P. K. (2015). Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips

The dimensional accuracy of a micro-CMM is significantly affected by contamination adhered to the stylus tip during use. Contaminant particles can cause dimensional errors that are orders of magnitude greater than those reported in the literature. To... Read More