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All Outputs (2)

Development of CO2 snow cleaning for in situ cleaning of µCMM stylus tips (2016)
Journal Article
Feng, X., Kinnell, P. K., & Lawes, S. (in press). Development of CO2 snow cleaning for in situ cleaning of µCMM stylus tips. Measurement Science and Technology, 28(1), https://doi.org/10.1088/1361-6501/28/1/015007

Contamination adhered to the surface of a µCMM stylus tip compromises the measurement accuracy of the µCMM system, potentially causing dimensional errors that are over ten times larger than the uncertainty of a modern µCMM. In prior work by the autho... Read More about Development of CO2 snow cleaning for in situ cleaning of µCMM stylus tips.

Contamination of µCMM stylus tips: on-machine inspection (2016)
Conference Proceeding
Feng, X., Lacorne, C., Fernandes, G. Q., Lawes, S., & Kinnell, P. (2016). Contamination of µCMM stylus tips: on-machine inspection.

Contamination adhered to the surface of a µCMM stylus tip significantly impairs the dimensional accuracy of a µCMM system. Regular cleaning of the stylus is essential to minimising the dimensional error but little data exists for determining appropri... Read More about Contamination of µCMM stylus tips: on-machine inspection.