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Control theory for scanning probe microscopy revisited

Stirling, Julian

Authors

Julian Stirling



Abstract

We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the SPM implementation of the proportional-integral controller to give realistic feedback behaviour. As such the stability of SPM feedback for a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation.

Journal Article Type Article
Publication Date Jan 1, 2014
Journal Beilstein Journal of Nanotechnology
Print ISSN 2190-4286
Electronic ISSN 2190-4286
Publisher Beilstein-Institut
Peer Reviewed Peer Reviewed
Volume 5
APA6 Citation Stirling, J. (2014). Control theory for scanning probe microscopy revisited. Beilstein Journal of Nanotechnology, 5, doi:10.3762/bjnano.5.38
DOI https://doi.org/10.3762/bjnano.5.38
Keywords AFM; control theory; feedback; scanning probe microscopy
Publisher URL http://www.beilstein-journals.org/bjnano/single/articleFullText.htm?publicId=2190-4286-5-38
Copyright Statement Copyright information regarding this work can be found at the following address: http://creativecommons.org/licenses/by/4.0
Additional Information This article is part of the Thematic Series "Advanced atomic force microscopy techniques II".

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Copyright Statement
Copyright information regarding this work can be found at the following address: http://creativecommons.org/licenses/by/4.0





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