Zhenyu Wang
Device loss model of a fully SiC based dual active bridge considering the effect of synchronous rectification and deadtime
Wang, Zhenyu; Castellazzi, Alberto
Authors
Alberto Castellazzi
Abstract
It is becoming a great interest to employ SiC based power devices in dual active bridge (DAB) converter as an alternative to conventional Si-IGBT, due to its higher switching frequency potential, smaller switching losses as well as the capability to operate at synchronous rectification (SR) condition. This paper introduces the device loss model of a SiC MOSFET power module based DAB converter considering the effect of synchronous rectification, and the dead-time effect is also discussed. The calculated device loss for both SiC-MOSFET and Si-IGBT are discussed. The results show that the overall device loss is reduced by 40%, where the conduction loss is reduced by 38% because of SR capability of SiC-MOSFET, and the switching loss is reduced by 48% due to the faster transient of SiC-MOSFET during dead-time. On the other hand, the device losses are not even between the primary bridge and the secondary bridge of the DAB converter, and it is more significant for SiC-MOSFET based DAB due to the effect of SR with a maximum of 20%. At last, the dead-time range is given based on the device properties.
Citation
Wang, Z., & Castellazzi, A. (2018). Device loss model of a fully SiC based dual active bridge considering the effect of synchronous rectification and deadtime. In Proceedings - 2017 IEEE Southern Power Electronics Conference (SPEC) (1-7). https://doi.org/10.1109/SPEC.2017.8333662
Conference Name | 2017 IEEE Southern Power Electronics Conference (SPEC) |
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Conference Location | Puerto Varas, Chile |
Start Date | Dec 4, 2017 |
End Date | Dec 7, 2017 |
Acceptance Date | Sep 26, 2017 |
Publication Date | Apr 9, 2018 |
Deposit Date | Aug 9, 2018 |
Publicly Available Date | Aug 9, 2018 |
Pages | 1-7 |
Book Title | Proceedings - 2017 IEEE Southern Power Electronics Conference (SPEC) |
ISBN | 978-1-5090-6426-7 |
DOI | https://doi.org/10.1109/SPEC.2017.8333662 |
Public URL | https://nottingham-repository.worktribe.com/output/986962 |
Publisher URL | https://ieeexplore.ieee.org/document/8333662/ |
Additional Information | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
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