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A comprehensive study of the short-circuit ruggedness of silicon carbide power MOSFETs

Romano, Gianpaolo; Fayyaz, Asad; Riccio, Michele; Maresca, Luca; Breglio, Giovanni; Castellazzi, Alberto; Irace, Andrea

A comprehensive study of the short-circuit ruggedness of silicon carbide power MOSFETs Thumbnail


Authors

Gianpaolo Romano

ASAD FAYYAZ ASAD.FAYYAZ@NOTTINGHAM.AC.UK
Senior Research Fellow

Michele Riccio

Luca Maresca

Giovanni Breglio

Alberto Castellazzi

Andrea Irace



Abstract

The behavior of Silicon Carbide Power MOSFETs under stressful short circuit conditions is investigated in this paper. Illustration of two different short-circuit failure phenomena for Silicon Carbide Power MOSFETs are thoroughly reported. Experimental evidences and TCAD electro-thermal simulations are exploited to describe and discriminate the failure sources. Physical causes are finally investigated and explained by means of properly calibrated numerical investigations, and are reported along with their effects on devices short-circuit capability.

Citation

Romano, G., Fayyaz, A., Riccio, M., Maresca, L., Breglio, G., Castellazzi, A., & Irace, A. (2016). A comprehensive study of the short-circuit ruggedness of silicon carbide power MOSFETs. IEEE Journal of Emerging and Selected Topics in Power Electronics, 4(3), 978-987. https://doi.org/10.1109/JESTPE.2016.2563220

Journal Article Type Article
Acceptance Date Apr 14, 2016
Online Publication Date May 4, 2016
Publication Date Sep 1, 2016
Deposit Date May 25, 2016
Publicly Available Date Mar 29, 2024
Journal IEEE Journal of Emerging and Selected Topics in Power Electronics
Electronic ISSN 2168-6785
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 4
Issue 3
Pages 978-987
DOI https://doi.org/10.1109/JESTPE.2016.2563220
Keywords Short-circuit failure mechanism, short-circuit ruggedness, Silicon Carbide (SiC) Power MOSFETs, thermal runaway
Public URL https://nottingham-repository.worktribe.com/output/975264
Publisher URL http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7464825&refinements%3D4225669346%26filter%3DAND%28p_IS_Number%3A6507303%29
Additional Information (c) 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.

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