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An improved soil ionization representation to numerical simulation of impulsive grounding systems

Gazzana, Daniel S.; Tronchoni, Alex B.; Leborgne, Roberto C.; Bretas, Arturo S.; Thomas, Dave W. P.; Christopoulos, Christos

Authors

Daniel S. Gazzana

Alex B. Tronchoni

Roberto C. Leborgne

Arturo S. Bretas

Dave W. P. Thomas

Christos Christopoulos



Abstract

This paper presents a hybrid method based on the transmission line modeling method (TLM) aiming to represent the soil ionization effect for grounding systems simulation. This natural phenomenon can be better represented by taking into account the variation of the conductive components present in the TLM circuit and considering the residual resistivity remaining in the soil. The proposed analytical formulation is developed with a focus on the computational implementation of the method. The model is validated by comparing synthetized test results with measured data and other numerical models (residual resistivity, TLM, and analytical model). High precision together with an easy to implement formulation indicates that the methodology presents potential for real-life applications.

Citation

Gazzana, D. S., Tronchoni, A. B., Leborgne, R. C., Bretas, A. S., Thomas, D. W. P., & Christopoulos, C. (2018). An improved soil ionization representation to numerical simulation of impulsive grounding systems. IEEE Transactions on Magnetics, 54(3), https://doi.org/10.1109/TMAG.2017.2750019

Journal Article Type Article
Acceptance Date Sep 4, 2017
Online Publication Date Sep 7, 2017
Publication Date Feb 21, 2018
Deposit Date Mar 23, 2018
Journal IEEE Transactions on Magnetics
Print ISSN 0018-9464
Electronic ISSN 0018-9464
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 54
Issue 3
DOI https://doi.org/10.1109/TMAG.2017.2750019
Keywords Grounding, lightning, numerical modeling, soil ionization, transmission line modeling method (TLM).
Public URL https://nottingham-repository.worktribe.com/output/913145
Publisher URL https://doi.org/10.1109/TMAG.2017.2750019
Additional Information © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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