Daniel S. Gazzana
An improved soil ionization representation to numerical simulation of impulsive grounding systems
Gazzana, Daniel S.; Tronchoni, Alex B.; Leborgne, Roberto C.; Bretas, Arturo S.; Thomas, Dave W. P.; Christopoulos, Christos
Authors
Alex B. Tronchoni
Roberto C. Leborgne
Arturo S. Bretas
Dave W. P. Thomas
Christos Christopoulos
Abstract
This paper presents a hybrid method based on the transmission line modeling method (TLM) aiming to represent the soil ionization effect for grounding systems simulation. This natural phenomenon can be better represented by taking into account the variation of the conductive components present in the TLM circuit and considering the residual resistivity remaining in the soil. The proposed analytical formulation is developed with a focus on the computational implementation of the method. The model is validated by comparing synthetized test results with measured data and other numerical models (residual resistivity, TLM, and analytical model). High precision together with an easy to implement formulation indicates that the methodology presents potential for real-life applications.
Citation
Gazzana, D. S., Tronchoni, A. B., Leborgne, R. C., Bretas, A. S., Thomas, D. W. P., & Christopoulos, C. (2018). An improved soil ionization representation to numerical simulation of impulsive grounding systems. IEEE Transactions on Magnetics, 54(3), https://doi.org/10.1109/TMAG.2017.2750019
Journal Article Type | Article |
---|---|
Acceptance Date | Sep 4, 2017 |
Online Publication Date | Sep 7, 2017 |
Publication Date | Feb 21, 2018 |
Deposit Date | Mar 23, 2018 |
Journal | IEEE Transactions on Magnetics |
Print ISSN | 0018-9464 |
Electronic ISSN | 0018-9464 |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Volume | 54 |
Issue | 3 |
DOI | https://doi.org/10.1109/TMAG.2017.2750019 |
Keywords | Grounding, lightning, numerical modeling, soil ionization, transmission line modeling method (TLM). |
Public URL | https://nottingham-repository.worktribe.com/output/913145 |
Publisher URL | https://doi.org/10.1109/TMAG.2017.2750019 |
Additional Information | © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
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