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Base-case model for measurement uncertainty in a reverberation chamber including frequency stirring

Gifuni, Angelo; Bastianelli, Luca; Moglie, Franco; Mariani Primiani, Valter; Gradoni, Gabriele

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Authors

Angelo Gifuni

Luca Bastianelli

Franco Moglie

Valter Mariani Primiani

Gabriele Gradoni



Abstract

We address the uncertainty of reverberation chamber (RC) measurements in presence of both mechanical and frequency stirring (FS). A base-case model is derived for reverberation fields affected by the measurement uncertainty due to the lack of a perfect statistical uniformity of fields in a RC. It is found that the measurement uncertainty associated with the FS depends on both the total uncorrelated samples and the local insertion loss (IL). The local IL depends on the frequency stirring bandwidth (FSB). The model allows us for obtaining separate measurement uncertainty contributions. Measurements support the achieved uncertainty model. In particular, results show that the dependence on the IL is normally rather weak also when very wide FSBs are used.

Citation

Gifuni, A., Bastianelli, L., Moglie, F., Mariani Primiani, V., & Gradoni, G. (in press). Base-case model for measurement uncertainty in a reverberation chamber including frequency stirring. IEEE Transactions on Electromagnetic Compatibility, https://doi.org/10.1109/TEMC.2017.2763627

Journal Article Type Article
Acceptance Date Oct 6, 2017
Online Publication Date Nov 9, 2017
Deposit Date Nov 27, 2017
Publicly Available Date Nov 27, 2017
Journal IEEE Transactions on Electromagnetic Compatibility
Print ISSN 0018-9375
Electronic ISSN 0018-9375
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
DOI https://doi.org/10.1109/TEMC.2017.2763627
Keywords Frequency stirring (FS); Measurement uncertainty; Mechanical stirring (MS); Reverberation chamber (RC); Uncertainty quantification
Public URL https://nottingham-repository.worktribe.com/output/893841
Publisher URL http://ieeexplore.ieee.org/document/8100957/
Additional Information c)2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.

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