F.M. Aboshady
Fast fault location scheme for distribution systems based on fault transients
Aboshady, F.M.; Thomas, David W.P.; Sumner, M.
Authors
Abstract
This paper presents a combined double-end and single-end fault locator for distribution systems. The technique lies under the impedance based category and uses the fault generated high frequency components to locate the faults. The combination of double-end and single-end allows the method to discriminate between faults on the main feeder and those on laterals. Also, the method only requires a short data window as it depends on the high frequency components. The evaluation of the method considers different system and fault parameters e.g. loading taps, loading unbalance, fault type and fault resistance. To validate the proposed technique, the IEEE 34 nodes system is used to simulate different test cases.
Citation
Aboshady, F., Thomas, D. W., & Sumner, M. (2017). Fast fault location scheme for distribution systems based on fault transients. In IET International Conference on Resilience of Transmission and Distribution Networks (RTDN 2017) (1-6). https://doi.org/10.1049/cp.2017.0327
Conference Name | IET International Conference on Resilience of Transmission and Distribution Networks (RTDN 2017) |
---|---|
Conference Location | Birmingham |
Start Date | Sep 26, 2017 |
End Date | Sep 28, 2017 |
Acceptance Date | Jun 15, 2017 |
Online Publication Date | May 21, 2018 |
Publication Date | 2017 |
Deposit Date | Oct 4, 2017 |
Publicly Available Date | Mar 29, 2024 |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Pages | 1-6 |
Book Title | IET International Conference on Resilience of Transmission and Distribution Networks (RTDN 2017) |
ISBN | 978-1-78561-662-4 |
DOI | https://doi.org/10.1049/cp.2017.0327 |
Keywords | Fault location; distribution system; high frequency; impedance based methods |
Public URL | https://nottingham-repository.worktribe.com/output/865676 |
Publisher URL | https://ieeexplore.ieee.org/document/8361259/ |
Additional Information | © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
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