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Fast fault location scheme for distribution systems based on fault transients

Aboshady, F.M.; Thomas, David W.P.; Sumner, M.

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Authors

F.M. Aboshady

David W.P. Thomas

MARK SUMNER MARK.SUMNER@NOTTINGHAM.AC.UK
Professor of Electrical Energy Systems



Abstract

This paper presents a combined double-end and single-end fault locator for distribution systems. The technique lies under the impedance based category and uses the fault generated high frequency components to locate the faults. The combination of double-end and single-end allows the method to discriminate between faults on the main feeder and those on laterals. Also, the method only requires a short data window as it depends on the high frequency components. The evaluation of the method considers different system and fault parameters e.g. loading taps, loading unbalance, fault type and fault resistance. To validate the proposed technique, the IEEE 34 nodes system is used to simulate different test cases.

Citation

Aboshady, F., Thomas, D. W., & Sumner, M. (2017). Fast fault location scheme for distribution systems based on fault transients. In IET International Conference on Resilience of Transmission and Distribution Networks (RTDN 2017) (1-6). https://doi.org/10.1049/cp.2017.0327

Conference Name IET International Conference on Resilience of Transmission and Distribution Networks (RTDN 2017)
Conference Location Birmingham
Start Date Sep 26, 2017
End Date Sep 28, 2017
Acceptance Date Jun 15, 2017
Online Publication Date May 21, 2018
Publication Date 2017
Deposit Date Oct 4, 2017
Publicly Available Date Mar 29, 2024
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Pages 1-6
Book Title IET International Conference on Resilience of Transmission and Distribution Networks (RTDN 2017)
ISBN 978-1-78561-662-4
DOI https://doi.org/10.1049/cp.2017.0327
Keywords Fault location; distribution system; high frequency; impedance based methods
Public URL https://nottingham-repository.worktribe.com/output/865676
Publisher URL https://ieeexplore.ieee.org/document/8361259/
Additional Information © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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