In-situ fabrication of gold nanoparticle functionalized probes for tip-enhanced Raman spectroscopy by dielectrophoresis

Sweetenham, Claire Sue; Woolley, Richard; Notingher, Ioan

Abstract

We report the use of dielectrophoresis to fabricate in-situ probes for tip-enhanced Raman spectroscopy (TERS) based on Au nanoparticles. A typical conductive atomic force microscope (AFM) was used to functionalize iridium-coated conductive silicon probes with Au nanoparticles of 10-nm diameter. Suitable TERS probes can be rapidly produced (30 to 120 s) by applying a voltage of 10 Vpp at a frequency of 1 MHz. The technique has the advantage that the Au-based probes are ready for immediate use for TERS measurements, minimizing the risks of tip contamination and damage during handling. Scanning electron microscopy and energy dispersive x-ray spectroscopy were used to confirm the quality of the probes, and used samples of p-ATP monolayers on silver substrates were used to demonstrate experimentally TERS measurements.

Citation

Sweetenham, C. S., Woolley, R., & Notingher, I. (2016). In-situ fabrication of gold nanoparticle functionalized probes for tip-enhanced Raman spectroscopy by dielectrophoresis. Journal of Nanophotonics, 10(3), 1-7. https://doi.org/10.1117/1.JNP.10.030502

• Journal Article Type: Article
• Acceptance Date: Jul 25, 2016
• Publication Date: Aug 18, 2016
• Deposit Date: Sep 1, 2016
• Publicly Available Date: Sep 1, 2016
• Journal: Journal of Nanophotonics
• Electronic ISSN: 1934-2608
• Publisher: Society of Photo-optical Instrumentation Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 10
• Issue: 3
• Article Number: 030502
• Pages: 1-7
• DOI: https://doi.org/10.1117/1.JNP.10.030502
• Keywords: tip-enhanced Raman spectroscopy; dielectrophoresis; gold nanoparticles
• Public URL: https://nottingham-repository.worktribe.com/output/805243
• Publisher URL: http://nanophotonics.spiedigitallibrary.org/article.aspx?articleid=2546056