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Overload robust IGBT design for SSCB application

Supono, I.; Urresti, J.; Castellazzi, Alberto; Flores, D.

Authors

I. Supono

J. Urresti

Alberto Castellazzi alberto.castellazzi@nottingham.ac.uk

D. Flores



Abstract

This paper presents an optimised power semiconductor architecture based on the CIGBT approach to be used in solid-state circuit breaker (SSCB) applications where the conduction losses have to be as low as possible without compromising the forward voltage blocking capability. Indeed, a high overcurrent turn-off and short-circuit withstand capabilities have to be ensured. Starting from a standard NPT-IGBT design for switching applications, the results show that the proposed device, which is optimised by the application of the individual clustered concept, offers a reduction in conduction losses of 13%, without compromise on voltage blocking capability. An original design solution is implemented to further ensure short-circuit and overload turn-off capabilities at maximum ambient temperature and twice the nominal rated current.

Citation

Supono, I., Urresti, J., Castellazzi, A., & Flores, D. (in press). Overload robust IGBT design for SSCB application. Microelectronics Reliability, 54(9/10), https://doi.org/10.1016/j.microrel.2014.07.146

Journal Article Type Article
Acceptance Date Jul 18, 2014
Online Publication Date Aug 13, 2014
Deposit Date Jul 14, 2016
Publicly Available Date Jul 14, 2016
Journal Microelectronics Reliability
Print ISSN 0026-2714
Electronic ISSN 0026-2714
Publisher Elsevier
Peer Reviewed Peer Reviewed
Volume 54
Issue 9/10
DOI https://doi.org/10.1016/j.microrel.2014.07.146
Keywords Robust; Power device; IGBT; SSCB
Public URL http://eprints.nottingham.ac.uk/id/eprint/35023
Publisher URL http://www.sciencedirect.com/science/article/pii/S0026271414003485
Copyright Statement Copyright information regarding this work can be found at the following address: http://eprints.nottingh.../end_user_agreement.pdf

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Copyright Statement
Copyright information regarding this work can be found at the following address: http://eprints.nottingham.ac.uk/end_user_agreement.pdf





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