Characterization of energy storage devices for constant power applications

Kulsangcharoen, P.; Klumpner, Christian; Rashed, Mohamed; Asher, Greg

Abstract

In this paper, a few known characterization techniques for supercapacitors have been evaluated with the purpose of being able to predict the roundtrip efficiency of an energy storage system under constant power application. It is found that the user cannot rely on a single characterization method since the methods based on small signal disturbance are not very precise when the model is subjected to large signal variations.Also, methods based on large signal disturbance will not be very precise when subjected to small signal tests. By comparing the analytically estimated constant power round trip efficiency with experimental data, it is concluded that both models can give acceptable accuracy if a relevant DC bias is used.

Citation

Kulsangcharoen, P., Klumpner, C., Rashed, M., & Asher, G. (2010). Characterization of energy storage devices for constant power applications. In IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Societydoi:10.1109/IECON.2010.5675401

• Conference Name: 36th Annual Conference on IEEE Industrial Electronics Society (IECON)
• End Date: Nov 10, 2010
• Acceptance Date: Jun 1, 2010
• Publication Date: Nov 10, 2010
• Deposit Date: Jul 12, 2016
• Publicly Available Date: Jul 12, 2016
• Peer Reviewed: Peer Reviewed
• Book Title: IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
• DOI: https://doi.org/10.1109/IECON.2010.5675401
• Public URL: http://eprints.nottingham.ac.uk/id/eprint/34825
• Publisher URL: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5675401
• Copyright Statement: Copyright information regarding this work can be found at the following address: http://eprints.nottingham.ac.uk/end_user_agreement.pdf
• Additional Information: Published in: 36th Annual conference on IEEE Industrial Electronics Society, 7 - 10 November 2010, Renaissance Glendale Hotel & Spa, Glendale, AZ, USA : proceedings. Piscataway, N.J. : IEEE, 2010, p. 1805-1810. ISBN 9781424452255. doi: 10.1109/IECON.2010.5675401