Angelo Gifuni
On the Estimated Measurement Uncertainty of the Insertion Loss in a Reverberation Chamber Including Frequency Stirring
Gifuni, Angelo; Bastianelli, Luca; Migliaccio, Maurizio; Moglie, Franco; Mariani Primiani, Valter; Gradoni, Gabriele
Authors
Luca Bastianelli
Maurizio Migliaccio
Franco Moglie
Valter Mariani Primiani
GABRIELE GRADONI GABRIELE.GRADONI@NOTTINGHAM.AC.UK
Associate Professor
Abstract
In this paper, we present an improved model of measurement standard uncertainty of the insertion loss in a reverberation chamber (RC), including frequency stirring. Differently from the previous model, the enhanced one does not require specific conditions on the parameter to be measured. Such an enhancement is applicable for all usable measurement conditions in RCs. Moreover, a majorant is derived, that is obtained under a weak condition on the coefficient of variation of the parameter to be measured. Results from measurements support the validity of both the proposed enhancement and the majorant.
Citation
Gifuni, A., Bastianelli, L., Migliaccio, M., Moglie, F., Mariani Primiani, V., & Gradoni, G. (2019). On the Estimated Measurement Uncertainty of the Insertion Loss in a Reverberation Chamber Including Frequency Stirring. IEEE Transactions on Electromagnetic Compatibility, 61(5), 1414-1422. https://doi.org/10.1109/temc.2018.2870073
Journal Article Type | Article |
---|---|
Acceptance Date | Aug 21, 2018 |
Online Publication Date | Sep 27, 2018 |
Publication Date | Oct 1, 2019 |
Deposit Date | Dec 11, 2018 |
Publicly Available Date | Dec 13, 2018 |
Journal | IEEE Transactions on Electromagnetic Compatibility |
Print ISSN | 0018-9375 |
Electronic ISSN | 1558-187X |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Volume | 61 |
Issue | 5 |
Pages | 1414-1422 |
DOI | https://doi.org/10.1109/temc.2018.2870073 |
Keywords | Electrical and Electronic Engineering |
Public URL | https://nottingham-repository.worktribe.com/output/1406369 |
Publisher URL | https://ieeexplore.ieee.org/document/8474326 |
Additional Information | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
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